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ADS1605 参数 Datasheet PDF下载

ADS1605图片预览
型号: ADS1605
PDF下载: 下载PDF文件 查看货源
内容描述: 16位5MSPS模数转换器 [16 BIT 5MSPS ANALOG TO DIGITAL CONVERTER]
分类和应用: 转换器模数转换器
文件页数/大小: 32 页 / 425 K
品牌: BB [ BURR-BROWN CORPORATION ]
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ꢋꢑ ꢉꢀ ꢁ ꢗ ꢇ  
ꢋꢑ ꢉꢀ ꢁ ꢗ ꢁ  
www.ti.com  
SBAS274E − MARCH 2003 − REVISED JUNE 2004  
ORDERING INFORMATION  
SPECIFIED  
TEMPERATURE  
RANGE  
PACKAGE  
DESIGNATOR  
PACKAGE  
MARKING  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA, QUANTITY  
PRODUCT  
PACKAGE−LEAD  
(1)  
ADS1605IPAPT  
ADS1605IPAPR  
ADS1606IPAPT  
ADS1606IPAPR  
Tape and Reel, 250  
Tape and Reel, 1000  
Tape and Reel, 250  
Tape and Reel, 1000  
TQFP−64  
PowerPAD  
ADS1605  
ADS1606  
PAP  
PAP  
−40°C to +85°C  
−40°C to +85°C  
ADS1605I  
ADS1606I  
TQFP−64  
PowerPAD  
(1)  
For the most current specification and package information, refer to our web site at www.ti.com.  
PRODUCT FAMILY  
ABSOLUTE MAXIMUM RATINGS  
(1)  
over operating free-air temperature range unless otherwise noted  
PRODUCT  
ADS1605  
ADS1606  
ADS1625  
ADS1626  
RESOLUTION  
16 Bits  
DATA RATE  
FIFO?  
No  
ADS1605, ADS1606  
−0.3 to +6  
UNIT  
5.0MSPS  
5.0MSPS  
1.25MSPS  
1.25MSPS  
AVDD to AGND  
V
V
V
V
16 Bits  
18 Bits  
18 Bits  
Yes  
No  
DVDD to DGND  
−0.3 to +3.6  
IOVDD to DGND  
−0.3 to +6  
Yes  
AGND to DGND  
−0.3 to +0.3  
Input Current  
100mA, Momentary  
10mA, Continuous  
−0.3 to AVDD + 0.3  
−0.3 to IOVDD + 0.3  
+150  
This integrated circuit can be damaged by ESD. Texas  
Instruments recommends that all integrated circuits be  
handledwith appropriate precautions. Failure to observe  
Input Current  
Analog I/O to AGND  
Digital I/O to DGND  
Maximum Junction Temperature  
Operating Temperature Range  
Storage Temperature Range  
Lead Temperature (soldering, 10s)  
V
V
proper handling and installation procedures can cause damage.  
°C  
°C  
°C  
°C  
ESD damage can range from subtle performance degradation to  
complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could  
cause the device not to meet its published specifications.  
−40 to +105  
−60 to +150  
+260  
(1)  
Stresses above these ratings may cause permanent damage.  
Exposure to absolute maximum conditions for extended periods  
may degrade device reliability. These are stress ratings only, and  
functional operation of the device at these or any other conditions  
beyond those specified is not implied.  
2
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