ꢉꢃ ꢠꢡ ꢢ ꢣ ꢤ
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SBAS341B − DECEMBER 2004 − REVISED APRIL 2005
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handledwith appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ADS1602 passes standard 200V machine model and 1.5K CDM
testing. ADS1602 passes 1kV human body model testing (TI Standard
is 2kV).
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information see
the Package Option Addendum located at the end of this
datasheet or visit the TI web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1)
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ADS1602
−0.3 to +6
UNIT
AVDD to AGND
V
V
V
V
DVDD to DGND
−0.3 to +3.6
IOVDD to DGND
−0.3 to +6
AGND to DGND
−0.3 to +0.3
Input Current
100mA, Momentary
10mA, Continuous
−0.3 to AVDD + 0.3
−0.3 to IOVDD + 0.3
+150
Input Current
Analog I/O to AGND
Digital I/O to DGND
Maximum Junction Temperature
Operating Temperature Range
Storage Temperature Range
Lead Temperature (soldering, 10s)
V
V
°C
°C
°C
°C
−40 to +105
−60 to +150
+260
(1)
Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not implied.
2
BB [ BURR-BROWN CORPORATION ]
