ADS1230
www.ti.com
SBAS366–OCTOBER 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)(1)
ADS1230
–0.3 to +6
UNIT
V
AVDD to AGND
DVDD to DGND
AGND to DGND
–0.3 to +6
V
–0.3 to +0.3
V
100, Momentary
10, Continuous
–0.3 to AVDD + 0.3
–0.3 to DVDD + 0.3
+150
mA
mA
V
Input Current
Analog Input Voltage to AGND
Digital Input Voltage to DGND
Maximum Junction Temperature
Operating Temperature Range
Storage Temperature Range
V
°C
°C
°C
–40 to +85
–60 to +150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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