欢迎访问ic37.com |
会员登录 免费注册
发布采购

ADS1222 参数 Datasheet PDF下载

ADS1222图片预览
型号: ADS1222
PDF下载: 下载PDF文件 查看货源
内容描述: 24位模拟数字转换器, 2通道差分输入多路复用器 [24 BIT ANALOG TO DIGITAL CONVERTER WITH 2-CHANNEL DIFFERENTIAL INPUT MULTIPLEXER]
分类和应用: 转换器复用器输入元件
文件页数/大小: 21 页 / 237 K
品牌: BB [ BURR-BROWN CORPORATION ]
 浏览型号ADS1222的Datasheet PDF文件第1页浏览型号ADS1222的Datasheet PDF文件第3页浏览型号ADS1222的Datasheet PDF文件第4页浏览型号ADS1222的Datasheet PDF文件第5页浏览型号ADS1222的Datasheet PDF文件第6页浏览型号ADS1222的Datasheet PDF文件第7页浏览型号ADS1222的Datasheet PDF文件第8页浏览型号ADS1222的Datasheet PDF文件第9页  
www.ti.com  
SBAS314A − APRIL 2004 − REVISED SEPTEMBER 2004  
ORDERING INFORMATION  
PACKAGE  
DESIGNATOR  
PACKAGE  
MARKING  
TRANSPORT MEDIA,  
QUANTITY  
PRODUCT  
PACKAGE-LEAD  
ORDERING NUMBER  
(1)  
ADS1222IPWT  
ADS1222IPWR  
Tape and Reel, 250  
Tape and Reel, 2000  
ADS1222  
TSSOP-14  
PW  
ADS1222  
(1)  
For the most current specification and package information, refer to our web site at www.ti.com.  
This integrated circuit can be damaged by ESD. Texas  
Instruments recommends that all integrated circuits be  
handledwith appropriate precautions. Failure to observe  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range unless otherwise noted  
(1)  
proper handling and installation procedures can cause damage.  
ADS1222  
−0.3 to +6  
UNIT  
VDD to GND  
Input current  
V
ESD damage can range from subtle performance degradation to  
complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could  
cause the device not to meet its published specifications.  
100, momentary  
10, continuous  
−0.3 to VDD + 0.3  
−0.3 to VDD + 0.3  
+150  
mA  
mA  
V
Analog input voltage to GND  
Digital input voltage to GND  
Maximum Junction Temperature  
Operating Temperature Range  
Storage Temperature Range  
Lead Temperature (soldering, 10s)  
V
°C  
°C  
°C  
°C  
−55 to +125  
−60 to +150  
+300  
(1)  
Stresses above these ratings may cause permanent damage.  
Exposure to absolute maximum conditions for extended periods  
may degrade device reliability. These are stress ratings only, and  
functional operation of the device at these or any other conditions  
beyond those specified is not implied.  
2