SMPS Stacked MLC Capacitors
(SM Style) DSCC #87106 and #88011
Table II. Group A inspection.
U.S. Preferred Styles
Requirement
paragraph of
MIL-PRF-49470
Test method
paragraph of
MIL-PRF-49470
Inspection
Sampling procedure
Subgroup 1
Thermal shock and voltage conditioning 1/
3.9
4.8.5
4.8.4
100ꢀ inspection
Subgroup 2
Visual and mechanical examination:
Material
Physical dimensions
Interface requirements
(other than physical dimensions)
Marking 2/
3.4
3.1
13 samples
0 failures
3.5 and 3.5.1
3.28
3.30
Workmanship
1/ Post checks are required (see paragraph 3.9 of MIL-PRF-49470).
2/ Marking defects are based on visual examination only. Any subsequent electrical defects shall not
be used as a basis for determining marking defects.
Table III. Group B inspection. 1/
Requirement
paragraph of
MIL-PRF-49470
Test method
paragraph of
MIL-PRF-49470
Number of
sample units
to be inspected
Number of
defectives
permitted 2/
Inspection
Subgroup 1 3/
Temperature coefficient
Resistance to solvents 5/ 6/
Immersion
4/
4/
3.23
3.18
3.24
4.8.20
4.8.15
4.8.10
12
12
6
1
Terminal strength 5/
Subgroup 2
Resistance to soldering heat
Moisture resistance
3.20
3.21
4.8.17
4.8.18
1
1
6/ 1
Subgroup 3
Marking legibility
(laser marking only)
3.28.1
4.8.4.1
Subgroup 4
Solderability
3.15
3.26
4.8.12
4.8.22
3
0
0
Subgroup 5
Life
5 minimum
per case code
1/ Unless otherwise specified herein, when necessary, mounting of group B samples shall be at the
discretion of the manufacturer.
2/ A sample unit having one or more defects shall be charged as a single defective.
3/ Order of tests is at discretion of manufacturer.
4/ See 3.2.3 of DSCC 87106.
5/ Sample size shall be 3 pieces with zero defectives permitted.
6/ Total of one defect allowed for combination of subgroup 1, subgroup 2, and subgroup 3 inspections.
95
KYOCERA AVX [ KYOCERA AVX ]
