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0101ZC471KA72A 参数 Datasheet PDF下载

0101ZC471KA72A图片预览
型号: 0101ZC471KA72A
PDF下载: 下载PDF文件 查看货源
内容描述: [Ceramic Capacitor, Multilayer, Ceramic, 10V, 10% +Tol, 10% -Tol, X7R, 15% TC, 0.00047uF, Surface Mount, 0101, CHIP]
分类和应用: 电容器
文件页数/大小: 4 页 / 511 K
品牌: KYOCERA AVX [ KYOCERA AVX ]
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X7R Dielectric  
Specifications and Test Methods  
Parameter/Test  
Operating Temperature Range  
Capacitance  
X7R Specification Limits  
-55ºC to +125ºC  
Within specified tolerance  
Measuring Conditions  
Temperature Cycle Chamber  
Freq.: 1.0 kHz ± 10%  
Voltage: 1.0Vrms ± .2V  
For Cap > 10µF, 0.5Vrm @ 120Hz  
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating  
≤ 12.5% for 25V and 16V DC rating  
≤ 12.5% for ≤ 10V DC rating  
Dissipation Factor  
Contact Factory for DF by PN  
100,000MΩ or 1000MΩ - µF,  
whichever is less  
Charge device with rated voltage for  
120 ± 5 secs @ room temp/humidity  
Insulation Resistance  
Charge device with 250% of rated voltage for 1-5  
seconds, w/charge and discharge current limited  
to 50 mA (max)  
Dielectric Strength  
No breakdown or visual defects  
Note: Charge device with 150% of rated voltage  
for 500V devices.  
Appearance  
Capacitance  
Variation  
No defects  
≤ ±12%  
Resistance to  
Flexure  
Stresses  
Deflection: 2mm  
Test Time: 30 seconds  
Dissipation  
Factor  
Insulation  
Resistance  
Meets Initial Values (As Above)  
≥ Initial Value x 0.3  
≥ 95% of each terminal should be covered with  
fresh solder  
Dip device in eutectic solder at 230 ± 5ºC  
for 5.0 ± 0.5 seconds  
Solderability  
Appearance  
Capacitance  
Variation  
No defects, <25% leaching of either end terminal  
≤ ±7.5%  
Dissipation  
Factor  
Dip device in eutectic solder at 260ºC for 60  
seconds. Store at room temperature for 24 ±  
2hours before measuring electrical properties.  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Resistance to  
Solder Heat  
Insulation  
Resistance  
Dielectric  
Strength  
Appearance  
Capacitance  
Variation  
No visual defects  
≤ ±7.5%  
Step 1: -55ºC ± 2º  
30 ± 3 minutes  
≤ 3 minutes  
Step 2: Room Temp  
Dissipation  
Factor  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Step 3: +125ºC ± 2º  
Step 4: Room Temp  
30 ± 3 minutes  
≤ 3 minutes  
Thermal Shock  
Insulation  
Resistance  
Dielectric  
Strength  
Appearance  
Repeat for 5 cycles and measure after 24 ± 2  
hours at room temperature  
Meets Initial Values (As Above)  
No visual defects  
Capacitance  
Variation  
Charge device with 1.5 rated voltage (≤ 10V) in  
test chamber set at 125ºC ± 2ºC for 1000 hours  
(+48, -0)  
≤ ±12.5%  
Dissipation  
Factor  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
If RV > 10V then Life Test voltage will be 2xRV  
but there are exceptions (please contact AVX for  
further details on exceptions)  
Insulation  
Resistance  
Load Life  
Dielectric  
Strength  
Remove from test chamber and stabilize at room  
temperature for 24 ± 2 hours before measuring.  
Meets Initial Values (As Above)  
Appearance  
Capacitance  
Variation  
No visual defects  
≤ ±12.5%  
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±  
5% relative humidity for 1000 hours (+48, -0) with  
rated voltage applied.  
Dissipation  
Factor  
Insulation  
Resistance  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
Load  
Humidity  
Remove from chamber and stabilize at room  
temperature and humidity for 24 ± 2 hours before  
measuring.  
Dielectric  
Strength  
Meets Initial Values (As Above)  
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or  
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.  
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