+5 V
PULSE GEN.
Z
O
= 50
Ω
t
f
= t
r
= 5 ns
I
I
1
2
INPUT
MONITORING
NODE
R
M
3
4
V
CC
8
7
6
*C
L
GND
5
0.1µF
BYPASS
R
L
OUTPUT V
O
MONITORING
NODE
100
t
P
– PROPAGATION DELAY – ns
V
CC
= 5 V
I
I
= 7.5 mA
t
PLH
, R
L
= 4 KΩ
80
t
PHL
, R
L
= 350
Ω
1 KΩ
60
4 KΩ
40
*C
L
IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
I
I
= 7.50 mA
I
I
= 3.75 mA
t
PHL
OUTPUT
V
O
t
PLH
t
PLH
, R
L
= 1 KΩ
t
PLH
, R
L
= 350
Ω
INPUT
I
I
20
0
-60 -40 -20
1.5 V
0
20
40
60
80 100
T
A
– TEMPERATURE – °C
Figure 6. Test circuit for t
PHL
and t
PLH
.
105
t
P
– PROPAGATION DELAY – ns
Figure 7. Typical propagation delay vs.
temperature.
PWD – PULSE WIDTH DISTORTION – ns
V
CC
= 5 V
T
A
= 25°C
t
PLH
, R
L
= 4 KΩ
40
R
L
= 4 kΩ
30
V
CC
= 5 V
I
I
= 7.5 mA
20
R
L
= 350 kΩ
90
75
t
PLH
, R
L
= 350
Ω
t
PLH
, R
L
= 1 KΩ
t
PHL
, R
L
= 350
Ω
1 KΩ
4 KΩ
5
7
9
11
13
15
60
10
45
30
0
R
L
= 1 kΩ
-10
-60 -40 -20
0
20
40
60
80 100
I
I
– PULSE INPUT CURRENT – mA
T
A
– TEMPERATURE – °C
Figure 8. Typical propagation delay vs. pulse
input current.
Figure 9. Typical pulse width distortion vs.
temperature.
PULSE GEN.
Z
O
= 50
Ω
t
f
= t
r
= 5 ns
INPUT V
E
MONITORING NODE
+5 V
1
7.5 mA
I
I
2
3
4
V
CC
8
7
6
*C
L
GND
5
0.1 µF
R
BYPASS
L
t
E
– ENABLE PROPAGATION DELAY – ns
OUTPUT V
O
MONITORING
NODE
120
V
CC
= 5 V
V
EH
= 3 V
V
EL
= 0 V
90 I
I
= 7.5 mA
t
ELH
, R
L
= 4 kΩ
*C
L
IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
3.0 V
INPUT
V
E
t
EHL
OUTPUT
V
O
t
ELH
1.5 V
60
t
ELH
, R
L
= 1 kΩ
30
t
ELH
, R
L
= 350
Ω
t
EHL
, R
L
= 350
Ω,
1 kΩ, 4 kΩ
0
-60 -40 -20 0 20 40 60 80 100
T
A
– TEMPERATURE – °C
1.5 V
Figure 10. Test circuit for t
EHL
and t
ELH
.
Figure 11. Typical enable propagation delay
vs. temperature.
10
AVAGO [ AVAGO TECHNOLOGIES LIMITED ]
