EEPROM
AS8ER128K32
Austin Semiconductor, Inc.
1
CAPACITANCE TABLE (VIN = 0V, f = 1 MHz, TA = 25oC)
SYMBOL
PARAMETER
A0 - A16 Capacitance
MAX
40
UNITS
pF
CADD
COE
OE\, RES\, RDY Capacitance
WE\ and CE\ Capacitance
I/O 0- I/O 31 Capacitance
40
pF
CWE, CCE
CIO
12
pF
20
pF
NOTE: 1. This parameter is guaranteed but not tested.
AC TEST CHARACTERISTICS
TEST SPECIFICATIONS
I
OL
Input pulse levels...........................................VSS to 3V
Input rise and fall times...........................................5ns
Input timing reference levels.................................1.5V
Output reference levels.........................................1.5V
Output load................................................See Figure 1
Current Source
Device
-
+
Vz = 1.5V
(Bipolar
Supply)
Under
Test
+
Ceff = 50pf
NOTES:
I
Vz is programmable from -2V to + 7V.
IOL and IOH programmable from 0 to 16 mA.
Vz is typically the midpoint of VOH and VOL.
IOL and IOH are adjusted to simulate a typical resistive load
circuit.
Current Source
OH
Figure 1
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(-55oC < TA < +125oC or -40oC to +85oC; Vcc = 5V +10%)
150
DESCRIPTION
TEST CONDITIONS
SYMBOL
MIN
MAX
UNITS
tACC
Address to Output Delay
CE\ to Output Delay
OE\ to Output Delay
150
ns
CE\ = OE\ = VIL, WE\ = VIH
OE\ = VIL, WE\ = VIH
tCE
tOE
tOH
tDF
150
75
ns
ns
ns
ns
ns
ns
OE\ = VIL, WE\ = VIH
10
0
Address to Output Hold
CE\ = OE\ = VIL, WE\ = VIH
OE\ = VIL, WE\ = VIH
CE\ or OE\ high to Output Float (1)
RES\ low to Output Float (1)
RES\ to Output Delay
0
50
tDFR
tRR
CE\ = OE\ = VIL, WE\ = VIH
CE\ = OE\ = VIL, WE\ = VIH
0
350
450
0
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS8ER128K32
Rev. 5.3 6/05
4
AUSTIN [ AUSTIN SEMICONDUCTOR ]
