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AS29F010CW-15/XT 参数 Datasheet PDF下载

AS29F010CW-15/XT图片预览
型号: AS29F010CW-15/XT
PDF下载: 下载PDF文件 查看货源
内容描述: 128K ×8 FLASH制服行业5.0V FLASH MEMORY [128K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY]
分类和应用:
文件页数/大小: 22 页 / 242 K
品牌: AUSTIN [ AUSTIN SEMICONDUCTOR ]
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FLASH  
AS29F010  
Austin Semiconductor, Inc.  
After the sector erase command sequence is written, the  
system should read the status on DQ7 (Data\ Polling) or DQ6  
(Toggle Bit I) to ensure the device has accepted the command  
sequence, and then read DQ3. If DQ3 is “1”, the internally  
controlled erase cycle has begun; all further commands are  
ignored until the erase operation is complete. If DQ3 is “0”, the  
device will accept additional sector erase commands. To  
ensure the command has been accepted, the system software  
should check the status of DQ3 prior to and following each  
subsequent sector erase command. If DQ3 is high on the  
second status check, the last command might not have been  
accepted. Table 5 shows the outputs for DQ3.  
DQ3: Sector Erase Timer  
After writing a sector erase command sequence, the  
system may read DQ3 to determine whether or not an erase  
operation has begun. (The sector erase timer does not apply to  
the chip erase command.) If additional sectors are selected for  
erasure, the entire time-out also applies after each additional  
sector erase command. When the time-out is complete, DQ3  
switches from “0” to “1.” The system may ignore DQ3 if the  
system can guarantee that the time between additional sector  
erase commands will always be less than 50µs. See also the  
“Sector Erase Command Sequence” section.  
TABLE 5: WRITE OPERATION STATUS  
1
2
OPERATION  
DQ6  
Toggle  
Toggle  
No toggle  
Data  
DQ3  
N/A  
1
DQ7  
DQ5  
Embedded Program Algorithm  
DQ7\  
0
0
Standard  
Mode  
Embedded Erase Algorithm  
0
0
Erase  
Suspend  
Mode  
Reading within Erase Suspended Sector  
Reading within Non-Erase Suspended Sector  
1
N/A  
Data  
Data  
Data  
NOTES:  
1. DQ7 requires a valid address when reading status information. Refer to the appropriate subsection for further details.  
2. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. See “DQ5:  
Exceeding Timing Limits” for more information.  
ABSOLUTE MAXIMUM RATINGS*  
Ambient Temperature with Power Applied............-55°C to +125°C  
Voltage with Respect to Ground  
VCC1.................................................................-2.0Vto+7.0V  
A92................................................................-2.0Vto+13.0V  
All other pins1...............................................-2.0V to +7.0V  
Output Short Circuit Current3..................................................200mA  
VCC Supply Voltage..................................................+4.50V to +5.50V  
Storage Temperature..................................................-65°C to +125°C  
FIGURE 5: Maximum Negative  
Overshoot Waveform  
NOTES:  
1. Minimum DC voltage on input or I/O pin is -0.5V. During voltage transitions, input  
may overshoot V to -2.0V for periods of up to 20ns. See Figure 5. Maximum DC voltage  
SS  
on input and I/O pins is V + 0.5V. During voltage transitions, input and I/O pins may  
CC  
overshoot V + 2.0V for periods up to 20ns. See Figure 6.  
CC  
2. Minimum DC voltage on A9 pin is -0.5V. During voltage transitions, A9 pins may  
overshoot V to -2.0V for periods of up to 20ns. See Figure 5. Maximum DC input  
SS  
voltage on A9 is +12.5V which may overshoot to 14.0V for periods up to 20ns.  
3. No more than one output shorted at a time. Duration of the short circuit should not be  
greater than one second.  
*Stresses greater than those listed under "Absolute Maximum Ratings"  
may cause permanent damage to the device. This is a stress rating only  
and functional operation of the device at these or any other conditions  
above those indicated in the operation section of this specification is not  
implied. Exposure to absolute maximum rating conditions for extended  
FIGURE 6: Maximum Positive  
Overshoot Waveform  
periods may affect reliability.  
AS29F010  
AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.  
Rev. 0.3 10/02  
12