EEPROM
Austin Semiconductor, Inc.
CAPACITANCE
T
A
=+25
o
C, f= 1MHZ, V
CC
=5V
PARAMETER
Input Capacitance
Input / Output Capactiance
SYMBOL
C
IN(2)
C
I/O(2)
MAX
10
10
UNITS
pF
pF
Test Conditions
V
IN
=0V
V
I/O
=0V
AS28C010
POWER-UP TIMING
Symbol
t
PUR (2)
t
PUW (2)
Parameter
Power-up to Read Operation
Power-up to Write Operation
Max.
100
5
Units
s
ms
ENDURANCE AND DATA RETENTION
Parameter
Endurance
Endurance
Data Retention
Min.
10,000
100,000
100
Max.
Units
Cycles Per Byte
Cycles Per Page
Years
MODE SELECTION
MODE
READ
STANDBY
WRITE
CE\
V
IL
V
IH
V
IL
V
IL
X
X
V
IL
OE\
V
IL
X
V
IH
V
IH
X
V
IL
V
IL
WE\
V
IH
X
V
IL
V
IH
V
IH
X
V
IH
I/O
D
OUT
High-Z
D
IN
High-Z
---
---
Data Out
(I/O7)
A.C. CONDITIONS OF TEST
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Levels
0V to 3V
10ns
1.5V
DESELECT
WRITE
INHIBIT
DATA
POLLING
EQUIVALENT A.C. LOAD CURRENT
SYMBOL TABLE
Notes: (2) This parameter is periodically sampled and not 100% tested.
AS28C010
Rev. 1.5 5/06
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
5
AUSTIN [ AUSTIN SEMICONDUCTOR ]
