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ATMEGA32L-8AUR 参数 Datasheet PDF下载

ATMEGA32L-8AUR图片预览
型号: ATMEGA32L-8AUR
PDF下载: 下载PDF文件 查看货源
内容描述: [RISC Microcontroller, 8-Bit, FLASH, AVR RISC CPU, 8MHz, CMOS, PQFP44, 10 X 10 MM, 1 MM HEIGHT, 0.80 MM PITCH, GREEN, PLASTIC, MS-026ACB, TQFP-44]
分类和应用: 闪存微控制器
文件页数/大小: 347 页 / 3171 K
品牌: ATMEL [ ATMEL ]
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ATmega32(L)  
Figure 115. Reset Register  
To  
TDO  
From other Internal and  
External Reset Sources  
From  
TDI  
Internal Reset  
D
Q
ClockDR · AVR_RESET  
Boundary-scan Chain  
The Boundary-scan Chain has the capability of driving and observing the logic levels on  
the digital I/O pins, as well as the boundary between digital and analog logic for analog  
circuitry having Off-chip connections.  
See “Boundary-scan Chain” on page 229 for a complete description.  
Boundary-scan Specific The instruction register is 4-bit wide, supporting up to 16 instructions. Listed below are  
the JTAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ  
JTAG Instructions  
instruction is not implemented, but all outputs with tri-state capability can be set in high-  
impedant state by using the AVR_RESET instruction, since the initial state for all port  
pins is tri-state.  
As a definition in this datasheet, the LSB is shifted in and out first for all Shift Registers.  
The OPCODE for each instruction is shown behind the instruction name in hex format.  
The text describes which Data Register is selected as path between TDI and TDO for  
each instruction.  
EXTEST; $0  
IDCODE; $1  
2503J–AVR–10/06  
Mandatory JTAG instruction for selecting the Boundary-scan Chain as Data Register for  
testing circuitry external to the AVR package. For port-pins, Pull-up Disable, Output  
Control, Output Data, and Input Data are all accessible in the scan chain. For Analog cir-  
cuits having Off-chip connections, the interface between the analog and the digital logic  
is in the scan chain. The contents of the latched outputs of the Boundary-scan chain is  
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.  
The active states are:  
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.  
Shift-DR: The Internal Scan Chain is shifted by the TCK input.  
Update-DR: Data from the scan chain is applied to output pins.  
Optional JTAG instruction selecting the 32-bit ID-register as Data Register. The ID-reg-  
ister consists of a version number, a device number and the manufacturer code chosen  
by JEDEC. This is the default instruction after power-up.  
The active states are:  
Capture-DR: Data in the IDCODE-register is sampled into the Boundary-scan  
Chain.  
Shift-DR: The IDCODE scan chain is shifted by the TCK input.  
227  
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