ATmega640/1280/1281/2560/2561
TA = -40°C to 85°C, VCC = 1.8V to 5.5V (unless otherwise noted) (Continued)
Symbol
Parameter
Condition
Min.
Typ.
Max.
Units
Active 1MHz, VCC = 2V
0.5
0.8
mA
(ATmega640/1280/2560/1V)
Active 4MHz, VCC = 3V
3.2
10
5
14
mA
mA
mA
mA
mA
(ATmega640/1280/2560/1L)
Active 8MHz, VCC = 5V
(ATmega640/1280/1281/2560/2561)
Power Supply Current(5)
Idle 1MHz, VCC = 2V
0.14
0.7
2.7
0.22
1.1
4
ICC
(ATmega640/1280/2560/1V)
Idle 4MHz, VCC = 3V
(ATmega640/1280/2560/1L)
Idle 8MHz, VCC = 5V
(ATmega640/1280/1281/2560/2561)
WDT enabled, VCC = 3V
WDT disabled, VCC = 3V
<5
<1
15
µA
µA
Power-down mode
7.5
VCC = 5V
Analog Comparator
Input Offset Voltage
VACIO
IACLK
tACID
<10
40
50
mV
nA
ns
Vin = VCC/2
Analog Comparator
Input Leakage Current
VCC = 5V
Vin = VCC/2
-50
Analog Comparator
Propagation Delay
VCC = 2.7V
VCC = 4.0V
750
500
Notes: 1. "Max" means the highest value where the pin is guaranteed to be read as low
2. "Min" means the lowest value where the pin is guaranteed to be read as high
3. Although each I/O port can sink more than the test conditions (20mA at VCC = 5V, 10mA at VCC = 3V) under steady state
conditions (non-transient), the following must be observed:
ATmega1281/2561:
1.)The sum of all IOL, for ports A0-A7, G2, C4-C7 should not exceed 100 mA.
2.)The sum of all IOL, for ports C0-C3, G0-G1, D0-D7 should not exceed 100 mA.
3.)The sum of all IOL, for ports G3-G5, B0-B7, E0-E7 should not exceed 100 mA.
4.)The sum of all IOL, for ports F0-F7 should not exceed 100 mA.
ATmega640/1280/2560:
1.)The sum of all IOL, for ports J0-J7, A0-A7, G2 should not exceed 200 mA.
2.)The sum of all IOL, for ports C0-C7, G0-G1, D0-D7, L0-L7 should not exceed 200 mA.
3.)The sum of all IOL, for ports G3-G4, B0-B7, H0-B7 should not exceed 200 mA.
4.)The sum of all IOL, for ports E0-E7, G5 should not exceed 100 mA.
5.)The sum of all IOL, for ports F0-F7, K0-K7 should not exceed 100 mA.
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test condition.
4. Although each I/O port can source more than the test conditions (20mA at VCC = 5V, 10mA at VCC = 3V) under steady
state conditions (non-transient), the following must be observed:
ATmega1281/2561:
1)The sum of all IOH, for ports A0-A7, G2, C4-C7 should not exceed 100 mA.
2)The sum of all IOH, for ports C0-C3, G0-G1, D0-D7 should not exceed 100 mA.
3)The sum of all IOH, for ports G3-G5, B0-B7, E0-E7 should not exceed 100 mA.
4)The sum of all IOH, for ports F0-F7 should not exceed 100 mA.
ATmega640/1280/2560:
1)The sum of all IOH, for ports J0-J7, G2, A0-A7 should not exceed 200 mA.
2)The sum of all IOH, for ports C0-C7, G0-G1, D0-D7, L0-L7 should not exceed 200 mA.
371
2549L–AVR–08/07