III. Result of Reliability Stress for AO4915 (Standard) &
AO4915L (Green)
Test Item
Test Condition
Time Point
Lot Attribution
Total Sample
size
14410 pcs
Number of
Failures
0
Solder Reflow
Precondition
Normal: 1hr PCT+3
cycle IR reflow@240℃
℃
(260℃ for Green)
℃
Temp = 150 C,
Vgs=100% of Vgsmax
0hr
Normal: 81 lots
Green: 23 lots
(Note B**)
HTGB
168 / 500
hrs
1000 hrs
168 / 500
hrs
246 pcs
(Note A*)
77+5 pcs / lot
246 pcs
(Note A*)
77+5 pcs / lot
3740 pcs
50+5 pcs / lot
0
HTRB
Temp = 150 C, Vds=80%
of Vdsmax
0
HAST
130 +/- 2 C, 85%, 33.3
psi, Vgs = 80% of Vgs
max
121 C, 15+/-1 PSIG,
RH=100%
1000 hrs
100 hrs
Normal: 52 lots
Green: 16 lots
(Note B**)
Normal: 70 lots
Green: 20 lots
(Note B**)
Normal: 81 lots
Green: 23 lots
(Note B**)
0
Pressure Pot
96 hrs
4950 pcs
50+5 pcs / lot
0
Temperature
Cycle
-65 to 150 deg C, air to
air, 0.5hr per cycle
250 / 500
cycles
5720 pcs
50+5 pcs / lot
0
DPA
Internal Vision
Cross-section
X-ray
NA
5
5
5
5
40
40
40
15
5
5
5
5
40 wires
40 wires
40 wires
15 leads
0
CSAM
Bond Integrity
Room Temp
150
C bake
150
C bake
230
C
NA
0hr
250hr
500hr
5 sec
0
0
Solderability
0
Note A:
The HTGB and HTRB reliability data presents total of available AO4915 and
AO4915L
burn-in data up to the published date.
Note B:
The pressure pot, temperature cycle and HAST reliability data for
AO4915L
comes
from the AOS generic green compound package qualification data.
AOSMD [ ALPHA & OMEGA SEMICONDUCTORS ]
