APW7037/A/B
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
Description
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
245 C , 5 SEC
°
1000 Hrs Bias @ 125 C
°
168 Hrs, 100 % RH , 121 C
°
-65 C ~ 150 C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
°
°
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ko
Ao
D1
T2
J
C
A
B
T1
A
B
C
J
T1
2 + 0.5 12.4 +0.2
Po P1
T2
W
P
E
Application
12.75
+0.15
12 + 0.3
- 0.1
330 1
62 1.5
2 0.2
±
8 0.1
±
1.75 0.1
±
±
±
F
D
D1
Ao
Bo
Ko
t
SOP-8
1.55+0.25
5.5 0.1 1.55 +0.1
4.0 0.1 2.0 0.1 6.4 0.1 5.2 0.1 2.1 0.1 0.3 0.013
±
±
±
±
±
±
±
±
Application
TSSOP-8
A
B
C
J
T1
T2
W
P
E
12.75+
0.15
330
1
62 +1.5
2 + 0.5 12.4 0.2
2
0.2
12 0. 3
8 0.1 1.75 0.1
± ±
±
±
±
±
F
D
D1
Po
P1
Ao
Bo
Ko
t
5.5 0. 1 1.5 + 0.1 1.5 + 0.1 4.0 0.1 2.0 0.1 7.0 0.1 3.6 0.3 1.6 0.1 0.3 0.013
±
±
±
±
±
±
±
(mm)
Copyright ANPEC Electronics Corp.
Rev. A.6 - Apr, 2005
10
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
