APR3101/2/3
Reliability test program
Test item
SO LD ER A BILITY
H O LT
PC T
TST
M ethod
D escription
M IL-STD -883D -2003
M IL-STD -883D -1005.7
JESD -22-B, A102
M IL-STD -883D -1011.9
M IL-STD -883D -3015.7
JESD 78
245 C , 5 S EC
°
1000 H rs Bias @ 125
C
°
168 H rs, 100 % R H , 121 C
°
-65 C ~ 150 C , 200 C ycles
VH B M > 2KV, VM M > 200V
10m s , Itr > 100m A
°
°
ESD
Latch-U p
Carrier Tape
t
D
P
Po
E
F
P1
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
A
B
C
J
T1
T2
W
P
E
Application
SOT-23-5
8.0+ 0.3
- 0.3
178 1
72 1.0 13.0 + 0.2 2.5 0.15 8.4
2
1.5 0.3
4
0.1
1.75 0.1
±
±
±
±
±
±
±
F
D
D1
Po
P1
Ao
Bo
Ko
t
3.5 0.05 1.5 +0.1 1.5 +0.1 4.0 0.1 2.0 0.1 3.15 0.1 3.2 0.1
1.4 0.1 0.2 0.03
± ±
±
±
±
±
±
(mm)
Copyright ANPEC Electronics Corp.
Rev. A.3 - Feb., 2004
13
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
