APR3021/2/3
Reliability test program
Test item
SOLDERABILITY
HOLT
Method
Description
245°C, 5 SEC
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B,A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
1000 Hrs Bias @125°C
168 Hrs, 100%RH, 121°C
-65°C~150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms, 1tr > 100mA
PCT
TST
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ao
D1
Ko
T2
J
C
A
B
T1
Copyright ANPEC Electronics Corp.
Rev. A.2 - Oct., 2003
14
www.anpec.com.tw