APL5885
Reliability test Program
Test item
SOLDERABILITY
HOLT
Method
Description
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
°
245 C , 5 SEC
°
1000 Hrs Bias @ 125 C
PCT
°
168 Hrs, 100 % RH , 121 C
TST
MIL-STD-883D-1011.9
°
°
-65 C ~ 150 C, 200 Cycles
ESD
Latch-Up
MIL-STD-883D-3015.7
JESD 78
VHBM > 2KV, VMM > 200V
10ms , I > 100mA
tr
Carrier Tape & Reel Dimensions
t
D
P
Po
E
F
P1
Bo
W
Ao
D1
Ko
T2
J
C
A
B
T1
A
B
C
13.5
0.15
D1
J
T1
T2
W
P
E
Application
SOT-89
12 + 0.3
12 - 0.1
Bo
±
178 1
70
2
3
0.15
14
2
1.3 0.3
8
0.1 1.75 0.1
± ±
±
±
±
±
±
F
D
Po
P1
Ao
Ko
t
Application
SOT-89 5.5 0.05 1.5 0.1 1.5 0.1 4.0 0.1 2.0 0.1 4.8 0.1 4.5 0.1 1.80 0.1 0.3 0.013
±
±
±
±
±
±
±
±
±
(mm)
10
www.anpec.com.tw
Copyright
ANPEC Electronics Corp.
Rev. A.6 - Apr., 2003
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
