APL431
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
Description
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
245 C , 5 SEC
°
1000 Hrs Bias @ 125 C
°
168 Hrs, 100 % RH , 121 C
°
-65 C ~ 150 C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
°
°
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ko
Ao
D1
T2
J
C
A
B
T1
A
B
C
J
T1
0.5 12.4 0.2
Po P1
T2
0.2
Ao
W
P
E
Application
SOP- 8
12.75+
330
1
62 +1.5
D
2
2
12 0. 3
8 0.1
1.75 0.1
0.15
F
D1
Bo
Ko
t
5.5 1
A
1.55 +0.1 1.55+ 0.25 4.0 0.1 2.0 0.1 6.4 0.1 5.2 0. 1 2.1 0.1 0.3 0.013
B
C
J
T1
T2
W
P
E
Application
SOT-23
8.0+ 0.3
178 1
60 1.0
12.0
2.5 0.15 9.0 0.5
1.4
4.0
1.75
- 0.3
F
D
D1
Po
P1
Ao
Bo
Ko
t
3.5 0.05 1.5 +0.1
0.1MIN
p
4.0
2.0 0.05
3.1
3.0
1.3
0.2 0.03
(mm)
Copyright ANPEC Electronics Corp.
14
www.anpec.com.tw
Rev. C.1 - Jun., 2003
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
