APL1086
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
Description
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
245 C , 5 SEC
°
1000 Hrs Bias @ 125 C
°
168 Hrs, 100 % RH , 121 C
°
-65 C ~ 150 C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
°
°
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
TO-252
A
B
C
J
T1
T2
W
P
E
16.4 + 0.3
-0.2
16+ 0.3
- 0.1
330 ±3
100 ± 2 13 ± 0. 5 2 ± 0.5
D1 Po
2.5± 0.5
8 ± 0.1 1.75± 0.1
Ko
F
D
P1
Ao
Bo
t
7.5 ± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 6.8 ± 0.1 10.4± 0.1 2.5± 0.1 0.3±0.05
Application
TO-263
A
B
C
J
T1
T2
W
P
E
24 + 0.3
- 0.1
380±3
80 ± 2 13 ± 0. 5 2 ± 0.5
D1 Po
24 ± 4
2± 0.3
16 ± 0.1 1.75± 0.1
F
D
P1
Ao
Bo
Ko
t
0.35±0.01
11.5 ± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 10.8 ± 0.1 16.1± 0.1 5.2± 0.1
3
(mm)
Copyright ANPEC Electronics Corp.
Rev. A.4 - Jun., 2003
13
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
