APA3541/4
Reliability test Program
Test item
SOLDERABILITY
HOLT
Method
Description
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
°
245 C , 5 SEC
°
1000 Hrs Bias @ 125 C
PCT
°
168 Hrs, 100 % RH , 121 C
TST
MIL-STD-883D-1011.9
°
°
-65 C ~ 150 C, 200 Cycles
ESD
Latch-Up
MIL-STD-883D-3015.7
JESD 78
VHBM > 2KV, VMM > 200V
10ms , I > 100mA
tr
Carrier Tape & Reel Dimensions
t
D
P
Po
E
F
P1
Bo
W
Ao
D1
Ko
T2
J
C
A
B
T1
A
B
C
Application
SOP- 8
J
T1
T2
W
P
E
12.75+
0.15
330
1
62 +1.5
D
2
0.5
12.4 0.2
2
0.2
12 0. 3
±
8
0.1
1.75 0.1
±
±
±
±
±
±
F
D1
Po
P1
Ao
Bo
Ko
t
5.5
1
1.55 +0.1 1.55+ 0.25 4.0 0.1
2.0 0.1
6.4 0.1
5.2 0. 1
2.1 0.1 0.3 0.013
± ±
±
±
±
±
±
Copyright ANPEC Electronics Corp.
Rev. B.1 -Apr., 2003
12
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
