APA2020
Reliability Test Program
Test item
SOLDERABILITY
HOLT
Method
Description
245°C, 5 SEC
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B,A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
1000 Hrs Bias @125°C
168 Hrs, 100%RH, 121°C
-65°C~150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms, 1tr > 100mA
PCT
TST
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ko
Ao
D1
T2
J
C
A
B
T1
A
B
C
J
T1
T2
W
P
E
Application
SOP- 24
12.75
0.15
±
330 1
62 1.5
2
0.6 24.4 0.2
2 0.2
±
24 0.3
12 0.1 1.75 0.1
±
±
±
±
±
±
±
F
D
D1
Po
P1
Ao
Bo
Ko
t
11.5 0.1 1.55 +0.1 1.5+ 0.25 4.0 0.1 2.0 0.1 10.9 0.1 15.9 0.1 3.1 0.1 0.35 0.05
±
±
±
±
±
±
±
A
B
C
J
T1
T2
W
P
E
Application
TSSOP- 24
330 1
100 ref
13 0.5
2 0.5
±
16.4 0.2
2 0.2
±
16 0.3
12 0.1 1.75 0.1
±
±
±
±
±
±
F
D
D1
Po
P1
Ao
Bo
Ko
t
7.5 0.1
1.5 +0.1
1.5 min
4.0 0.1
2.0 0.1
6.9 0.1
8.3 0.1
1.5 0.1 0.3 0.05
± ±
±
±
±
±
±
(mm)
Copyright ANPEC Electronics Corp.
Rev. A.8 - Nov., 2002
24
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
