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AS1545-BQFT 参数 Datasheet PDF下载

AS1545-BQFT图片预览
型号: AS1545-BQFT
PDF下载: 下载PDF文件 查看货源
内容描述: 双通道, 12位, 1MSPS , SAR ADC [Dual, 12-Bit, 1MSPS, SAR ADC]
分类和应用:
文件页数/大小: 34 页 / 1591 K
品牌: AMSCO [ AMS(艾迈斯) ]
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AS1545  
Datasheet - Terminology  
8 Terminology  
Acquisition Time  
The Acquisition time is the time needed by the ADC to accurately acquire the analog input voltage in the internal  
sampling capacitor. During this time the ADC is in track mode.  
Conversion Time  
The Conversion Time is the time that the ADC needs to convert an acquired analog input into a corresponding digital  
code. A Successive Approximation Register ADC usually needs a number of clocks dependant on the resolution.  
During this time the ADC is in hold mode.  
Throughput / Sample Rate  
The Throughput or Sample Rate is the number of conversions performed by an ADC per second. It is usually specified  
in Samples Per Second (SPS). The Throughput or Sample Rate is the reciprocal of the sum of Acquisition Time and  
Conversion Time.  
Aperture Delay  
The Aperture Delay defines the time between the falling edge of CSN and the actual Sampling Instant. The Aperture  
Delay Matching defines the maximum deviation of Aperture Delays across all 6 channels of one ADC.  
Aperture Jitter  
The Aperture Jitter is the deviation of the actual Sampling Instant. This deviation is totally random and the standard  
deviation of the distribution is calculated with one sigma.  
Differential Nonlinearity (DNL)  
The Differential Nonlinearity is the deviation between the actual code widths to the ideal code widths of 1 LSB,  
comparing all contiguous codes in the ADC. The ADC is specified according to its maximum and minimum DNL values  
across all codes. A DNL value equal to -1 indicates a missing code in the transfer function.  
Integral Nonlinearity (INL)  
The Integral Nonlinearity measures the deviation from the actual transfer function to the best straight line that  
minimizes the INL worst case values.  
Offset Error  
The Offset Error defines the absolute deviation of the first code transition (0x000h) to (0x001h) from the ideal input  
voltage (AGND + 0.5 LSB) in Single Ended and Pseudo Differential Mode (binary output coding).  
VIN  
VREF  
---------------  
Offset Error =  
× 4096 – AVG(MeasuredCodes)  
Offset Error Match  
The Offset Error Match defines the maximum deviation of the Offset Errors across all 6 channels of VIN in Single  
Ended and Pseudo Differential Mode (binary output coding).  
Gain Error  
The Gain Error defines the absolute deviation of the last code transition (0xFFEh) to (0xFFFh) from the ideal input  
voltage (VREF – 1.5 LSB) in Single Ended and Pseudo Differential Mode. The Offset Error is compensated.  
VIN  
VREF  
---------------  
Gain Error = OffsetError AVG(MeasuredCodes) –  
× 4096  
Gain Error Match  
The Gain Error Match defines the maximum deviation of the Gain Errors across all 6 channels of VIN in Single Ended  
and Pseudo Differential Mode (binary output coding).  
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Revision 1.01  
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