AMI Semiconductor, Inc.
Timing Test Conditions
Item
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
N256S0818HDA/N256S0830HDA
Advance Information
0.1V
CC
to 0.9 V
CC
5ns
0.5 V
CC
CL = 100pF
-40 to +85
o
C
Timing
Item
Clock Frequency
Clock Rise Time
Clock Fall Time
Clock High Time
Clock Low Time
Clock Delay Time
CS Setup Time
CS Hold Time
CS Disable Time
SCK to CS
Data Setup Time
Data Hold Time
Output Valid From Clock Low
Output Hold Time
Output Disable Time
HOLD Setup Time
HOLD Hold Time
HOLD Low to Output High-Z
HOLD High to Output Valid
Symbol
f
CLK
t
R
t
F
t
HI
t
LO
t
CLD
t
CSS
t
CSH
t
CSD
t
SCS
t
SU
t
HD
t
V
t
HO
t
DIS
t
HS
t
HH
t
HZ
t
HV
10
10
10
50
0
20
10
10
10
40
25
25
25
25
50
25
5
10
10
25
0
15
1.8V Device
Min.
Max.
20
2
2
20
20
20
20
40
20
5
10
10
20
3V Device
Min.
Max.
25
2
2
Units
MHz
us
us
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
This is a developmental specification and is subject to change without notice.
AMI [ AMI SEMICONDUCTOR ]
