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AM29LV800DT-70EC 参数 Datasheet PDF下载

AM29LV800DT-70EC图片预览
型号: AM29LV800DT-70EC
PDF下载: 下载PDF文件 查看货源
内容描述: 8兆位( 1一M× 8位/ 512的K× 16位) CMOS 3.0伏只引导扇区闪存 [8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory]
分类和应用: 闪存内存集成电路光电二极管
文件页数/大小: 51 页 / 1726 K
品牌: AMD [ AMD ]
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P R E L I M I N A R Y  
General Description  
The Am29LV800D is an 8 Mbit, 3.0 volt-only  
Flash memory organized as 1,048,576 bytes or  
524,288 words. The device is offered in 48-ball  
FBGA, 44-pin SO, and 48-pin TSOP packages.  
For more information, refer to publication  
number 21536. The word-wide data (x16)  
appears on DQ15–DQ0; the byte-wide (x8) data  
appears on DQ7–DQ0. This device requires only  
a single, 3.0 volt VCC supply to perform read,  
program, and erase operations. A standard  
EPROM programmer can also be used to program  
and erase the device.  
cuting the erase operation. During erase, the  
device automatically times the erase pulse  
widths and verifies proper cell margin.  
The host system can detect whether a program  
or erase operation is complete by observing the  
RY/BY# pin, or by reading the DQ7 (Data#  
Polling) and DQ6 (toggle) status bits. After a  
program or erase cycle has been completed, the  
device is ready to read array data or accept  
another command.  
The sector erase architecture allows memory  
sectors to be erased and reprogrammed without  
affecting the data contents of other sectors. The  
device is fully erased when shipped from the  
factory.  
This device is manufactured using AMD’s 0.23  
µm process technology, and offers all the fea-  
tures and benefits of the Am29LV800B, which  
was manufactured using 0.32 µm process tech-  
nology.  
Hardware data protection measures include  
a low VCC detector that automatically inhibits  
write operations during power transitions. The  
hardware sector protection feature disables  
both program and erase operations in any com-  
bination of the sectors of memory. This can be  
achieved in-system or via programming equip-  
ment.  
The standard device offers access times of 70,  
90, and 120 ns, allowing high speed micropro-  
cessors to operate without wait states. To elim-  
inate bus contention the device has separate  
chip enable (CE#), write enable (WE#) and  
output enable (OE#) controls.  
The device requires only a single 3.0 volt  
power supply for both read and write func-  
tions. Internally generated and regulated volt-  
ages are provided for the program and erase  
operations.  
The Erase Suspend feature enables the user to  
put erase on hold for any period of time to read  
data from, or program data to, any sector that  
is not selected for erasure. True background  
erase can thus be achieved.  
The device is entirely command set compatible  
with the JEDEC single-power-supply Flash  
standard. Commands are written to the  
command register using standard micropro-  
cessor write timings. Register contents serve as  
input to an internal state-machine that controls  
the erase and programming circuitry. Write  
cycles also internally latch addresses and data  
needed for the programming and erase opera-  
tions. Reading data out of the device is similar  
to reading from other Flash or EPROM devices.  
The hardware RESET# pin terminates any  
operation in progress and resets the internal  
state machine to reading array data. The  
RESET# pin may be tied to the system reset cir-  
cuitry. A system reset would thus also reset the  
device, enabling the system microprocessor to  
read the boot-up firmware from the Flash  
memory.  
The device offers two power-saving features.  
When addresses have been stable for a specified  
amount of time, the device enters the auto-  
matic sleep mode. The system can also place  
the device into the standby mode. Power con-  
sumption is greatly reduced in both these  
modes.  
Device programming occurs by executing the  
program command sequence. This initiates the  
Embedded Program algorithm—an internal  
algorithm that automatically times the program  
pulse widths and verifies proper cell margin. The  
Unlock Bypass mode facilitates faster pro-  
gramming times by requiring only two write  
cycles to program data instead of four.  
AMD’s Flash technology combines years of Flash  
memory manufacturing experience to produce  
the highest levels of quality, reliability and cost  
effectiveness. The device electrically erases  
all bits within a sector simultaneously via  
Fowler-Nordheim tunneling. The data is pro-  
grammed using hot electron injection.  
Device erasure occurs by executing the erase  
command sequence. This initiates the  
Embedded Erase algorithm—an internal algo-  
rithm that automatically preprograms the array  
(if it is not already programmed) before exe-  
2
Am29LV800D  
Am29LV800D_00_A4_E January 21, 2005  
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