25
20
15
10
5
I
Active
in mA
CC
55 C
°
0 C
°
25 C
°
70 C
°
125 C
°
0
0
1
2
3
4
5
6
7
8
9
10
11
12
Frequency in MHz
11560F-13
Figure 5. Am28F256—Average ICC Active vs. Frequency
V
CC = 5.5 V, Addressing Pattern = Minmax
Data Pattern = Checkerboard
TEST CONDITIONS
Table 6. Test Specifications
5.0 V
Test Condition
Output Load
-70
All others Unit
1 TTL gate
2.7 k
Ω
Device
Under
Test
Output Load Capacitance, C
(including jig capacitance)
L
30
100
pF
Input Rise and Fall Times
Input Pulse Levels
10
ns
V
≤
C
L
6.2 k
Ω
0.0–3.0 0.45–2.4
Input timing measurement
reference levels
1.5
1.5
0.8, 2.0
0.8, 2.0
V
V
Output timing measurement
reference levels
Note: Diodes are IN3064 or equivalent
11560G-14
Figure 6. Test Setup
Am28F256
25
AMD [ AMD ]
