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QT2032 参数 Datasheet PDF下载

QT2032图片预览
型号: QT2032
PDF下载: 下载PDF文件 查看货源
内容描述: [10 Gb/s Serial-to-XAUI PHY ICs for Ethernet and Fibre Channel LAN/ SAN/WAN Applications (CDR)]
分类和应用: 局域网
文件页数/大小: 220 页 / 2383 K
品牌: AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
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QT2022/32 - Data Sheet: DS3051  
7.2.3 LOF Defect Generation  
An LOF defect occurs when a Severely Errored Frame (SEF) persists for a period of 3ms. The LOF defect is termi-  
nated when no SEF defects are detected for a period T, where 1ms <= T <= 3ms.  
7.2.4 LOS Defect Generation  
An LOS defect occurs upon detection of no transitions on the incoming signal for time T, where T = 41.6667μs  
(three row periods). An LOS defect is terminated after a time period equal to the greater of 125μs or 2.5 T contain-  
ing no transition-free intervals of length T, where T = three row periods.  
Note: If no signal is applied to the fiber input, the WIS Synchronization process loses SYNC before the LOS, or  
LOF alarms are raised. Since the WIS suspends normal processes when there is a loss of WIS Sync, the LOS and  
LOF alarms will be masked. The WIS Synchronization alarm can be treated as an effective replacement for the  
LOS/LOF alarms.  
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AppliedMicro - Confidential & Proprietary  
Revision 5.11  
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