Chapter 15: Using the Agilent 3070 Tester for In-System Programming
15–5
Agilent 3070 Development Flow without the PLD ISP Software
Step 3: Convert SVF Files to PCF Files
You must convert the SVF Files to PCF Files for use with the Agilent 3070 tester with
the Altera svf2pcf conversion utility. The svf2pcf utility can create multiple PCF Files
for one device chain; running the utility allows you to specify the number of vectors
per file. The amount of memory used by the resulting files varies depending on the
data. The Agilent 3070 digital compiler looks for repeating patterns of vectors and
optimizes the directory and sequences RAM on the tester control card to apply the
maximum number of vectors before re-loading the files. The number of vectors in a
compiled PCF File ranges from 100,000 to over one million, depending on the size and
density of the targeted devices.
You can download the svf2pcf conversion utility from the Agilent ISP Support
website at www.altera.com.
Step 4: Create Executable Tests from Files
Creating digital tests for programming a chain of devices with the
Agilent 3070 tester requires the following steps:
1. Create the library for the target device or scan chain.
2. Run the Test Consultant.
3. Create digital tests.
4. Create the wirelist information for the tests.
5. Modify the test plan.
Create the Library for the Target Device or Scan Chain
The initial program development for the board contains a setup-only node test library
for the ISP boundary-scan chain interface. The test library ensures that Agilent 3070
tester resources are reserved in the test fixture for programming the targeted devices.
If only one target device is on the board and it is not part of a boundary-scan chain
(isolated), use a pin library; otherwise, use a node library. If using a pin library, you
must describe every device pin. Do not include test vectors in a test library.
The following code example shows a setup-only node test library.
!Setup only test for the boundary scan chain
assign TCK to nodes
assign TMS to nodes
assign TDI to nodes
assign TDO to nodes
inputs TCK, TMS, TDI
outputs TDO
"TCK"! Node name for the TCK pin
"TMS"! Node name for the TMS pin
"TDI"! Node name for the TDI pin
"TDO"! Node name for the TDO pin
pcf order is TCK, TMS, TDI, TDO! The order is defined by the program
that
! generates the PCF files.
Mark the TCKand TMSboundary-scan nodes as CRITICALin the Board Consultant.
This critical attribute minimizes the nodes’ wire length in the test fixture.
© October 2008 Altera Corporation
MAX II Device Handbook