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EPM240T100C5 参数 Datasheet PDF下载

EPM240T100C5图片预览
型号: EPM240T100C5
PDF下载: 下载PDF文件 查看货源
内容描述: [最大II器件]
分类和应用: 可编程逻辑器件输入元件PC
文件页数/大小: 295 页 / 3815 K
品牌: ALTERA [ ALTERA CORPORATION ]
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Chapter 15: Using the Agilent 3070 Tester for In-System Programming  
15–5  
Agilent 3070 Development Flow without the PLD ISP Software  
Step 3: Convert SVF Files to PCF Files  
You must convert the SVF Files to PCF Files for use with the Agilent 3070 tester with  
the Altera svf2pcf conversion utility. The svf2pcf utility can create multiple PCF Files  
for one device chain; running the utility allows you to specify the number of vectors  
per file. The amount of memory used by the resulting files varies depending on the  
data. The Agilent 3070 digital compiler looks for repeating patterns of vectors and  
optimizes the directory and sequences RAM on the tester control card to apply the  
maximum number of vectors before re-loading the files. The number of vectors in a  
compiled PCF File ranges from 100,000 to over one million, depending on the size and  
density of the targeted devices.  
You can download the svf2pcf conversion utility from the Agilent ISP Support  
website at www.altera.com.  
Step 4: Create Executable Tests from Files  
Creating digital tests for programming a chain of devices with the  
Agilent 3070 tester requires the following steps:  
1. Create the library for the target device or scan chain.  
2. Run the Test Consultant.  
3. Create digital tests.  
4. Create the wirelist information for the tests.  
5. Modify the test plan.  
Create the Library for the Target Device or Scan Chain  
The initial program development for the board contains a setup-only node test library  
for the ISP boundary-scan chain interface. The test library ensures that Agilent 3070  
tester resources are reserved in the test fixture for programming the targeted devices.  
If only one target device is on the board and it is not part of a boundary-scan chain  
(isolated), use a pin library; otherwise, use a node library. If using a pin library, you  
must describe every device pin. Do not include test vectors in a test library.  
The following code example shows a setup-only node test library.  
!Setup only test for the boundary scan chain  
assign TCK to nodes  
assign TMS to nodes  
assign TDI to nodes  
assign TDO to nodes  
inputs TCK, TMS, TDI  
outputs TDO  
"TCK"! Node name for the TCK pin  
"TMS"! Node name for the TMS pin  
"TDI"! Node name for the TDI pin  
"TDO"! Node name for the TDO pin  
pcf order is TCK, TMS, TDI, TDO! The order is defined by the program  
that  
! generates the PCF files.  
Mark the TCKand TMSboundary-scan nodes as CRITICALin the Board Consultant.  
This critical attribute minimizes the nodes’ wire length in the test fixture.  
© October 2008 Altera Corporation  
MAX II Device Handbook  
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