12. IEEE 1149.1 (JTAG) Boundary-Scan
Testing for the Cyclone III Device Family
December 2011
CIII51014-2.3
CIII51014-2.3
This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test
(BST) circuitry in Cyclone® III device family (Cyclone III and Cyclone III LS devices).
BST architecture tests pin connections without using physical test probes, and
captures functional data while a device is operating normally. Boundary-scan cells
(BSCs) in a device can force signals onto pins or capture data from pin or logic array
signals. Forced test data is serially shifted into the boundary-scan cells. Captured data
is serially shifted out and externally compared to expected results.
This chapter contains the following sections:
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“IEEE Std. 1149.1 BST Architecture” on page 12–1
“IEEE Std. 1149.1 BST Operation Control” on page 12–2
“I/O Voltage Support in a JTAG Chain” on page 12–5
“Guidelines for IEEE Std. 1149.1 BST” on page 12–6
“Boundary-Scan Description Language Support” on page 12–7
IEEE Std. 1149.1 BST Architecture
Cyclone III device family operating in the IEEE Std. 1149.1 BST mode use four
required pins:
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TDI
TDO
TMS
TCK
The TCKpin has an internal weak pull-down resistor, while the TDIand TMSpins have
weak internal pull-up resistors. The TDOoutput pin and all the JTAG input pins are
powered by the VCCIO supply of bank 1A. All user I/O pins are tri-stated during JTAG
configuration.
1
For recommendations on how to connect a JTAG chain with multiple voltages across
the devices in the chain, refer to “I/O Voltage Support in a JTAG Chain” on page 12–5.
f
For more information about the description and functionality of all JTAG pins,
registers used by the IEEE Std. 1149.1 BST circuitry, and the test access port (TAP)
controller, refer to AN39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices.
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Cyclone III Device Handbook
Volume 1
December 2011
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