Chapter 11: SEU Mitigation in the Cyclone III Device Family
11–3
Automated SEU Detection
In user mode, Cyclone III device family supports the CHANGE_EDREGJTAG instruction,
which allows you to write to the 32-bit storage register. You can use Jam™ STAPL files
(.jam) to automate the testing and verification process. This instruction can only be
executed when the device is in user mode, and it is a powerful design feature that
enables you to dynamically verify the CRC functionality in-system without having to
reconfigure the device. You can then switch to use the CRC circuit to check for real
errors induced by an SEU.
Table 11–1 lists the CHANGE_EDREGJTAG instructions.
Table 11–1. CHANGE_EDREG JTAG Instruction
JTAG Instruction Instruction Code
Description
This instruction connects the 32-bit CRC storage register between TDIand TDO
Any precomputed CRC is loaded into the CRC storage register to test the operation
.
CHANGE_EDREG
00 0001 0101
of the error detection CRC circuitry at the CRC_ERRORpin.
1
After the test completes, to clear the CRC error and restore the original CRC value,
power cycle the device or perform the following procedure:
1. After the configuration completes, use JTAG instruction CHANGE_EDREGto shift out
the correct precomputed CRC value and load the wrong CRC value to the CRC
storage register. The CRC_ERRORpin will be asserted and shows that a CRC error is
detected.
2. Use JTAG instruction CHANGE_EDREGto shift in the correct precomputed CRC value.
The CRC_ERRORpin is deasserted and shows that the error detection CRC circuitry
is working.
Automated SEU Detection
Cyclone III device family offers on-chip circuitry for automated checking of SEU
detection. Applications that require the device to operate error-free at high elevations
or in close proximity to earth’s North or South Pole require periodic checks to ensure
continued data integrity. The error detection cyclic redundancy code feature
controlled by the Device and Pin Options dialog box in the Quartus II software uses a
32-bit CRC circuit to ensure data reliability and is one of the best options for
mitigating SEU.
You can implement the error detection CRC feature with existing circuitry in
Cyclone III device family, eliminating the need for external logic. The CRC is
computed by the device during configuration and checked against an automatically
computed CRC during normal operation. The CRC_ERRORpin reports a soft error when
configuration CRAM data is corrupted, and you must decide whether to reconfigure
the FPGA by strobing the nCONFIGpin low or ignore the error.
CRC_ERROR Pin
A specific error detection pin, CRC_ERROR, is required to monitor the results of the error
detection circuitry during user mode.
December 2011 Altera Corporation
Cyclone III Device Handbook
Volume 1
ALTERA [ ALTERA CORPORATION ]
