8–6
Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices
IEEE Std. 1149.1 BST Operation Control
IEEE Std. 1149.1 BST Operation Control
MAX V devices implement the SAMPLE/PRELOAD, EXTEST, BYPASS, IDCODE, USERCODE,
CLAMPand HIGHZIEEE Std. 1149.1 BST instructions. The length of the BST instructions
is 10 bits. These instructions are described in detail later in this chapter.
f For a summary of the BST instructions and their instruction codes, refer to the JTAG
and In-System Programmability in MAX V Devices chapter.
The IEEE Std. 1149.1 TAP controller, a 16-state state machine clocked on the rising
edge of TCK, uses the TMSpin to control IEEE Std. 1149.1 operation in the device.
Figure 8–5 shows the TAP controller state machine.
Figure 8–5. IEEE Std. 1149.1 TAP Controller State Machine
TEST_LOGIC/
TMS = 1
TMS = 0
RESET
TMS = 0
TMS = 1
RUN_TEST/
IDLE
TMS = 1
TMS = 0
SELECT_IR_SCAN
SELECT_DR_SCAN
TMS = 1
TMS = 0
TMS = 1
TMS = 1
CAPTURE_DR
CAPTURE_IR
TMS = 0
TMS = 0
SHIFT_DR
SHIFT_IR
TMS = 0
TMS = 1
TMS = 0
TMS = 1
TMS = 1
TMS = 1
EXIT1_DR
EXIT1_IR
TMS = 0
TMS = 0
PAUSE_DR
PAUSE_IR
TMS = 0
TMS = 0
TMS = 1
TMS = 1
TMS = 0
TMS = 0
EXIT2_DR
EXIT2_IR
TMS = 1
TMS = 1
TMS = 1
TMS = 1
UPDATE_DR
UPDATE_IR
TMS = 0
TMS = 0
MAX V Device Handbook
December 2010 Altera Corporation
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