AS6UB51216
&
ꢓꢒꢊꢄꢔꢈꢄꢐꢍꢂꢁ
Supply
CS
H
L
CS2
X
WE
X
OE
X
LB
X
H
X
L
UB
X
H
X
H
L
Current I/O1–I/O8 I/O9–I/O16
Mode
ISB
High Z
High Z
Standby (ISB)
L
X
X
L
X
H
H
ICC
High Z
DOUT
High Z
DOUT
DIN
High Z
High Z
DOUT
DOUT
High Z
DIN
Output disable (ICC)
L
L
H
H
H
L
L
H
L
ICC
Read (ICC)
Write (ICC)
L
L
H
L
X
H
L
ICC
High Z
DIN
L
DIN
Key: X = Don’t care, L = Low, H = High.
ꢕꢖꢈꢗꢁꢃꢆꢏꢏꢁꢇꢋꢁꢋꢈꢆꢘꢁꢒꢐꢄꢅꢇꢉꢈꢃꢆꢇꢋꢅꢄꢅꢆꢇꢈꢙꢆꢚꢁꢒꢈꢄꢔꢁꢈꢆꢘꢁꢒꢐꢄꢅꢇꢉꢈꢒꢐꢇꢉꢁꢛ
Parameter
Vcc
Description
Test Conditions
Min
Max
Unit
V
Supply voltage
-
2.7
2.4
3.3
VOH
VOL
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Load Current
IOH = –1.0mA
V
IOL = 2.1mA
0.4
VCC + 0.2
0.6
V
VIH
-
2.2
–0.2
–1
V
VIL
-
V
IIX
GND < VIN < VCC
+1
µA
µA
IOZ
GND < VO < VCC; Outputs High Z
–1
+1
IOUT = 0mA,
f = 0
ICC
VCC Operating Supply Current
3
4
mA
mA
Average VCC Operating Supply
Current at 1 MHz
IOUT = 0mA,
f =1MHz
I
CC1 @ 1 MHz
30 mA at 55ns
40 mA at 70ns
Average VCC Operating Supply
Current
ICC2
I
OUT = 0mA, f = fMax
mA
CS1 > VCC – 0.2V or CS2< 0.2V or UB
= LB
> VIH, other inputs = VIL or VIH, f = 0
CS Power Down Current; TTL
Inputs
ISB
300
20
µA
CS1 > VCC – 0.2V or CS2< 0.2V
UB = LB > VCC – 0.2V
other inputs = 0V – VCC, f = fMax
CS Power Down Current; CMOS
Inputs
ISB1
µA
ꢀꢁ
Capacitance (f = 1 MHz, T = Room temperature, V = NOMINAL)
a
CC
Signals
Parameter
Input capacitance
Symbol
CIN
Test conditions
VIN = 0V
Max
5
Unit
pF
A, CS, WE, OE, LB, UB
I/O
I/O capacitance
CI/O
VIN = VOUT = 0V
7
pF
10/30/01; V.0.9.2
Alliance Semiconductor
P. 3 of 11
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
