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AS4C64M8D2-25BCN 参数 Datasheet PDF下载

AS4C64M8D2-25BCN图片预览
型号: AS4C64M8D2-25BCN
PDF下载: 下载PDF文件 查看货源
内容描述: [Fully synchronous operation]
分类和应用:
文件页数/大小: 59 页 / 1530 K
品牌: ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
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AS4C64M8D2  
ODT (On Die Termination)  
On Die Termination (ODT) is a feature that allows a DRAM to turn on/off termination resistance for each DQ,  
DQS/DQS#, DM signal via the ODT control pin. The ODT feature is designed to improve signal integrity of the  
memory channel by allowing the DRAM controller to independently turn on/off termination resistance for any or all  
DRAM devices.  
The ODT function is supported for ACTIVE and STANDBY modes. It is turned off and not supported in SELF  
REFRESH mode.  
Figure 4. Functional representation of ODT  
VDDQ  
VDDQ  
VDDQ  
SW1  
SW2  
SW3  
Rval1  
Rval2  
Rval3  
DRAM  
Input  
Buffer  
Input  
pin  
Rval1  
SW1  
Rval2  
SW2  
Rval3  
SW3  
VSSQ  
VSSQ  
VSSQ  
Switch (sw1, sw2, sw3) is enabled by ODT pin.  
Selection among sw1, sw2, and sw3 is determined by Rtt (nominal)in EMR.  
Termination included on all DQs, DM, DQS, DQS# pins  
Table 9. ODT DC Electrical Characteristics  
Parameter/Condition  
Symbol  
Min.  
Nom.  
Max.  
Unit Note  
Rtt effective impedance value for EMRS(A6,A2)=0,1;75Ω  
Rtt effective impedance value for EMRS(A6,A2)=1,0;150Ω  
Rtt effective impedance value for EMRS(A6,A2)=1,1;50Ω  
Ω
Ω
Ω
%
Rtt1(eff)  
Rtt2(eff)  
Rtt3(eff)  
60  
120  
40  
75  
150  
50  
-
90  
180  
60  
6
1
1
1
2
Rtt mismatch tolerance between any pull-up/pull-down pair Rtt(mis)  
-6  
NOTE 1: Measurement Definition for Rtt(eff):  
Apply VIH (ac) and VIL (ac) to test pin separately, then measure current I(VIH(ac)) and I(VIL(ac)) respectively.  
V (ac) V (ac)  
IH  
IL  
Rtt(eff)=  
I(V (ac))-I(V (ac))  
IH  
IL  
NOTE 2: Measurement Definition for Rtt (mis): Measure voltage (VM) at test pin (midpoint) with no load.  
2xVM  
VDDQ  
Rtt(mis)=  
1 100%  
Confidential  
13  
Rev. 1.0  
Feb. /2014  
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