AS3LC2M16
Capacitance
(f = 1 MHz, T
a
= Room temperature, V
CC
= NOMINAL)
Parameter
Input capacitance
I/O capacitance
Symbol
C
IN
C
I/O
Signals
A, CS, ZZ, WE, OE, LB, UB
I/O
Test conditions
V
IN
= 0V
V
IN
= V
OUT
= 0V
Max
5
7
Unit
pF
pF
Read cycle (over the operating range)
–55
Parameter
Read cycle time
Address access time
Chip select (CS) access time
Output enable (OE) access time
Output hold from address change
CS
ORZ W
o output in low Z
CS high to output in high Z
OE low to output in low Z
UB/LB access time
UB/LB low to low Z
UB/LB high to high Z
OE high to output in high Z
Page cycle time
Page access time
Symbol
t
RC
t
AA
t
ACS
t
OE
t
OH
t
CLZ
t
CHZ
t
OLZ
t
BA
t
BLZ
t
BHZ
t
OHZ
t
PC
t
PA
Min
55
–
–
–
10
10
0
5
–
10
0
0
–
–
Max
–
55
55
25
–
–
20
–
55
–
20
20
20
15
70
–
–
–
10
10
0
5
–
10
0
0
–
–
–70
Min
Max
–
70
70
35
–
–
25
–
70
–
25
25
25
20
85
–
–
–
10
10
0
5
–
10
0
0
–
–
–85
Min
Max
–
85
85
35
–
–
25
–
85
–
25
25
25
20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4, 5
4, 5
4, 5
5
4, 5
4, 5
4, 5
3
3
Notes
Key to switching waveforms
Rising input
Falling input
Undefined/don’t care
Read waveform 1 (address controlled)
(CS = OE = Low, WE = ZZ = High, UB and /or LB = Low)
t
RC
Address
t
OH
D
OUT
Previous data valid
t
AA
Data valid
t
OH
2/15/02; V.0.9.9
Alliance Semiconductor
P. 4 of 10
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
