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Device underTest
®
Test condition
-170
-200
1 TTL gate
5
Unit
100 pF*
Output load
Input rise and fall times
Input pulse levels
ns
V
V
VSS
0.0-2.0
*including scope
and jig capacitance
Input timing measurement reference levels
Output timing measurement reference levels
1.0
1.0
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Parameter
Symbol
VCC
Min
+4.5
0
Typical
Max
+5.5
0
Unit
V
5.0
0
Supply voltage
Input voltage
VSS
V
V
2.0
-
VCC + 0.5
0.8
V
V
IH
V
–0.5
-
IL
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Parameter
Symbol
Min
–2.0
–2.0
-0.5
–55
–65
-
Max
Unit
V
Input voltage (Input or DQ pin)
Input Voltage (A9 pin, OE, RESET)
Power supply voltage
V
+7.0
+13.0
+5.5
+125
+150
200
IN
V
V
IN
VCC
V
Operating temperature
TOPR
TSTG
IOUT
°C
°C
mA
Storage temperature (Plastic)
Short circuit output current
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions outside those indicated in the operational sections of this specification is notimplied. Exposure to absolute max-
imum rating conditions for extended periodsmay affect reliability.
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Parameter
Min
-1.0
-1.0
-100
Max
Unit
V
Input voltage with respect to V on A9, OE, and RESET pin
+13.0
VCC+1.0
+100
SS
Input voltage with respect to V on all DQ, address and control pins
V
SS
Current
mA
Includes all pins except V . Test conditions: V = 5.0V, one pin at a time.
CC
CC
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ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
