$65<)373
3UHOLPLQDU\#LQIRUPDWLRQ
®
(UDVH#DQG#SURJUDPPLQJ#SHUIRUPDQFH
Limits
Parameter
Min
Typical
1.0
45
Max
Unit
sec
Sector erase and verify-1 time (excludes 00h programming prior to erase)
-
-
Byte program time
-
-
-
µs
23
Chip programming time
Erase/ program cycles
-
-
sec
-
10,000
cycles
/DWFKXS#WROHUDQFH#
Parameter
Min
Max
Unit
Input voltage with respect to V on A9 and OE
-1.0
-1.0
-100
+13.0
VCC+1.0
+100
V
SS
Input voltage with respect to VSS on all DQ, address and control pins
Current
V
mA
Includes all pins except V . Test conditions: V = 5.0V, one pin at a time.
CC
CC
$&#WHVW#FRQGLWLRQV
Device underTest
Test condition
Unit
100 pF*
Output load
1 TTL gate
5
Input rise and fall times
Input pulse levels
ns
V
V
VSS
0.0-3.0
*including scope
and jig capacitance
Input timing measurement reference levels
Output timing measurement reference levels
1.5
1.5
$EVROXWH#PD[LPXP#UDWLQJV
Parameter
Symbol
Min
–2.0
–2.0
-0.5
–55
–65
-
Max
Unit
V
Input voltage (Input or DQ pin)
Input voltage (A9 pin, OE)
Power supply voltage
V
+7.0
+13.0
+5.5
+125
+125
200
IN
V
V
IN
VCC
V
Operating temperature
TOPR
TSTG
IOUT
°C
°C
mA
Storage temperature (plastic)
Short circuit output current
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Includes all pins except V . Test conditions: V = 5.0V, one pin at a time.
CC
CC
49
$//,$1&(#6(0,&21'8&725
','#440533440$1#728233
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
