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AS29F040-150LI 参数 Datasheet PDF下载

AS29F040-150LI图片预览
型号: AS29F040-150LI
PDF下载: 下载PDF文件 查看货源
内容描述: 5V 512K ×8 CMOS FLASH EEPROM [5V 512K x 8 CMOS FLASH EEPROM]
分类和应用: 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
文件页数/大小: 18 页 / 325 K
品牌: ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
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The AS29F040 is a 4-megabit, 5-volt-only Flash memory device organized as 512K bytes of 8 bits each. For flexible erase an  
program capability, the 4 megabits of data is divided into eight 64K-byte sectors. The ×8 data appears on DQ0–DQ7. The  
AS29F040 is offered in JEDEC standard 32-pin TSOP and 32-pin PLCC packages. This device is designed to be programmed an  
erased in-system with a single 5.0V VCC supply. The device can also be reprogrammed in standard EPROM programmers.  
The AS29F040 offers access times of 55/ 70/ 90/ 120/ 150 ns, allowing 0-wait state operation of high-speed microprocessors. To  
eliminate bus contention the device has separate chip enable (CE), write enable (WE), and output enable (OE) controls  
The AS29F040 is fully compatible with the JEDEC single power supply Flash standard. Write commands to the command register  
use standard microprocessor write timings. An internal state machine uses register contents to control the erase and programming  
circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Read data  
operates from the device in the same manner as other Flash or EPROM devices. The program command sequence is used to invoke  
the automated on-chip programming algorithm that automatically times the program pulse widths and verifies proper cell margin.  
The erase command sequence is used to invoke the automated on-chip erase algorithm that preprograms the sector if it is not  
already programmed before executing the erase operation, times the erase pulse widths, and verifies proper cell margin.  
Sector erase architecture allows specified sectors of memory to be erased and reprogrammed without altering data in other sectors .  
A sector typically erases and verifies within 1.0 seconds. Hardware sector protection disables both program and erase operations i n  
any or all combinations of the eight sectors. The device provides true background erase with Erase Suspend, which puts erase  
operations on hold to either read data from or program data to a sector that is not being erased. The chip erase command will  
automatically erase all unprotected sectors.  
A factory shipped AS29F040 is fully erased (all bits = 1). The programming operation sets bits to 0. Data is programmed into the  
array one byte at a time in any sequence and across sector boundaries. A sector must be erased to change bits from 0 to 1. Erase  
returns all bytes in a sector to the erased state (all bits = 1). Each sector is erased individually with no effect on other sectors.  
The device features single 5.0V power supply operation for read, write, and erase functions. Internally generated and regulate  
voltages are provided for the program and erase operations. A low VCC detector automatically inhibits write operations during  
power transtitions. DATA polling of DQ7 or toggle bit (DQ6) may be used to detect end-of-program or erase operations. The  
device automatically resets to read mode after program and/ or erase operations are completed.  
The AS29F040 resists accidental erasure or spurious programming signals resulting from power transitions. Control register  
architecture permits the alteration of memory contents only after successful completion of specific command sequences. During  
power up, the device is set to read mode with all program and/ or erase commands disabled when VCC is less than VLKO (lockout  
voltage). The command registers are not affected by noise pulses of less than 5 ns on OE, CE, or WE. CE and WE must be logical  
zero and OE a logical one to initiate write commands.  
The AS29F040 uses Fowler-Nordheim tunnelling to electrically erase all bits within a sector simultaneously. Bytes are programme  
one at a time using the EPROM programming mechanism of hot electron injection.  
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