PERFORMANCE CHARACTERISTICS OF EPAD®
PRECISION MATCHED PAIR MOSFET FAMILY (cont.)
SUB-THRESHOLD REGION OF OPERATION
PERFORMANCE CHARACTERISTICS
The gate threshold (turn-on) voltage V of the EPAD MOSFET
Performance characteristics of the EPAD MOSFET product family
are shown in the following graphs. In general, the gate threshold
voltage shift for each member of the product family causes other
GS(th)
is a voltage below which the MOSFET conduction channel rapidly
turns off. For analog designs, this gate threshold voltage directly
affects the operating signal voltage range and the operating bias
current levels.
affected electrical characteristics to shift linearly with V
bias
GS(th)
voltage. This linear shift in V causes the subthreshold I-V curves
GS
to shift linearly as well.Accordingly, the subthreshold operating cur-
rent can be determined by calculating the gate source voltage drop
At a voltage below V
, an EPAD MOSFET exhibits a turn-off
GS(th)
characteristic in an operating region called the subthreshold region.
This is when the EPAD MOSFET conduction channel rapidly turns
off as a function of decreasing applied gate voltage. The conduc-
tion channel, induced by the gate voltage on the gate electrode,
decreases exponentially and causes the drain current to decrease
exponentially as well. However, the conduction channel does not
shut off abruptly with decreasing gate voltage, but rather decreases
at a fixed rate of about 104mV per decade of drain current decrease.
For example, for the ALD2108xx device, if the gate threshold volt-
relative to its gate threshold voltage, V
.
GS(th)
NORMALLY-ON FIXED R
AT V = GROUND
DS(ON)
GS
Several members of this EPAD MOSFET family produce a fixed
resistance when their gate is grounded. For ALD210800, the drain
current at V
= 0.1V is @ 10µA at V
= 0.00V. Thus just by
grounding the gate of the ALD210800, a resistor with R
DS
GS
=
DS(ON)
= ~5 KΩ)
~10 KΩ is produced. ( For ALD212900 device, R
DS(ON)
age is +0.20V, the drain current is 10µA at V
= +0.20V. At V =
When an ALD214804 gate is grounded, the drain current I
=
GS
GS
DS
+0.096V, the drain current would decrease to 1µA. Extrapolating
from this, the drain current is about 0.1µA at V = 0.00V, 1nA at
424µA @ V
DS
= 0.1V, producing R
= ~236 Ω. Similarly,
DS(ON)
ALD214813 and ALD214835 produces 1.71mA and 3.33mA for
each MOSFET respectively at V = 0.0V, producing R
values of 59Ω and 30Ω, respectively. For example, when all 4
MOSFETs in an ALD214835 are connected in parallel, an on-re-
sistance of 30/4 =~ 7.5Ω is measured between the Drain and Source
GS
= -0.216V, and so forth. This subthreshold characteristic ex-
V
GS
GS DS(ON)
tends all the way down to current levels below 1nA and is limited by
junction leakage currents.
At a drain current of “zero current” as defined and selected by the
terminals when V
without any gate bias voltages applied to the device.
= V- = 0.00V, producing a fixed on-resistance
GS
user, the V
voltage at that zero current can now be estimated.
GS
Note that using the above example, with V
= +0.20V, the drain
GS(th)
current still hovers around 100nA when the gate is at ground volt-
age. With a device that has V = +0.40V (part number
MATCHING CHARACTERISTICS
GS(th)
ALD210804), the drain current is about 2nA when the gate is at
ground potential. Thus in this case an input signal referenced to
ground can operate with a natural drain current of only 2nA internal
bias current, dissipating nano-watts of power.
One of the key performance benefits of using matched-pair EPAD
MOSFETs is to maintain temperature tracking between the differ-
ent devices in the same package. In general, for EPAD MOSFET
matched pair devices, one device of the matched pair has gate
leakage currents, junction temperature effects, and drain current
temperature coefficient as a function of bias voltage that cancel
out similar effects of the other device, resulting in a temperature
stable circuit. As mentioned earlier, this temperature stability can
be further enhanced by biasing the matched-pairs at Zero Tempco
(ZTC) point, even though that may require special circuit configu-
rations and power consumption design considerations.
LOW POWER AND NANOPOWER
When supply voltages decrease, the power consumption of a given
load resistor decreases as the square of the supply voltage. Thus,
one of the benefits in reducing supply voltage is to reduce power
consumption. While decreasing power supply voltages and power
consumption go hand-in-hand with decreasing usefulAC bandwidth
and increased noise effects in the circuit, a circuit designer can
make the necessary tradeoffs and adjustments in any given circuit
design and bias the circuit accordingly for optimal performance.
POWER SUPPLY SEQUENCES AND ESD CONTROL
EPAD MOSFETs are robust and reliable, as demonstrated by more
than a decade of production history supplied to a large installed
base of customers across the world. However, these devices do
require a few design and handling precautions in order for them to
be used successfully.
With EPAD MOSFETs, a circuit that performs any specific function
can be designed so that power consumption of that circuit is mini-
mized. These circuits operate in low power mode where the power
consumed is measure in mW, µW, and nW (nano-watt) region and
still provide a useful and controlled circuit function operation.
EPAD MOSFETs, being a CMOS Integrated Circuit, in addition to
having Drain, Gate and Source pins normally found in a MOSFET
device, have three other types of pins, namely V+, V- and IC pins.
V+ is connected to the substrate, which must always be connected
to the most positive supply in a circuit. V- is the body of the MOSFET,
which must be connected to the most negative supply voltage in
the circuit. IC pins are internally connected pins, which must also
be connected to V-. Drain, Gate and Source pins must have volt-
ages between V- and V+ at all times.
ZERO TEMPERATURE COEFFICIENT (ZTC) OPERATION
For an EPAD MOSFET in this product family, operating points exist
where the various factors that cause the current to increase as a
function of temperature balance out those that cause the current to
decrease, thereby canceling each other, and resulting in a net tem-
perature coefficient of near zero. An example of this temperature
stable operating point is obtained by a ZTC voltage bias condition,
which is 0.38V above V
a temperature stable current level of about 380µAfor theALD2108xx
and 760µA for the ALD2129xx devices.
when V
= +0.1V, resulting in
Proper power-up sequencing requires powering up supply voltages
before applying any signals. During the power down cycle, remove
all signals before removing V- and V+. This way internally back
biased diodes are never allowed to become forward biased, possi-
bly causing damage to the device.
GS(th)
DS(ON)
Standard ESD control procedures should be observed so that static
charge does not degrade the performance of the devices.
ALD212900/ALD212900A
Advanced Linear Devices
4 of 12
ALD [ ADVANCED LINEAR DEVICES ]
