ASAHI KASEI
[AK2573A]
Ⅱ. Absolute Maximum Rating
Item
Supply Voltage
GND
Input voltage
Input Current
Storage Temperature
Symbol
Min
-0.3
0.0
-0.3
-10
-55
Max
6.0
0.0
Unit
V
V
Remarks
VDD
VSS
VIN
IIN
TSTG
Reference Voltage
Except VDD
VDD + 0.3
10
V
mA Except VDD
Note 1
130
°C
Stress beyond “Absolute Maximum Range” may cause permanent damage to the device.
Note 1: ExceptData retention. Data retention is prescribed at section-Ⅳ (2) EEPROM.
Ⅲ. Recommended Operation Conditions
Item
Operating Ambient
Power Supply
Symbol
Ta1
VDD1
VDD2
VSS
Min
-40
3.1
3.0
0.0
Typ
Max
85
3.5
3.5
0.0
Unit
°C
V
V
V
Remarks
3.3
3.3
0.0
Except AVDD
AVDD
ReferenceVoltage
Ⅳ. Electrical Characteristics
1. Power Consumption
Item
Symbol
IDD1
IDD2
IDD3
min
-
typ
7.8
15
-
max
Unit
Remarks
Supply Current 1 (All VDD)
Supply Current 2 (All VDD)
Supply Current 3 (AVDD only)
9.4
20
5
mA Note 1, 2, 3
mA Note 1, 2, 4
mA Note 1, 5
-
Note 1: without BIAS and modulation current
Note 2: I-DAC1 = 0, I-DAC2 = 0, Gain = 1, PDGAIN = 0dB, PDIN = 1V
Note 3: DATAP = CLKP = “L”, DATAN =CLKN = “H”
Note 4: 155.52Mbps, PN7
Note 5: I-DAC1 = I-DAC2 = FFh (Full code), Gain = 1, PDGAIN = 0dB, PDIN = 1V
2. EEPROM
Item
Endurance
Data retention
min
10000
10
max
-
-
Unit
Write Cycle Note 1
Year
Remarks
Junction Temperature = 85℃
Note 1: This parameter is characterized and is not 100% tested.
Important Notice: The AKM factory adjusted data are stored in advance at address location (Device Address = A6h,
Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to
the AK2573A which exceeds a guaranteed EEPROM data retention conditions (for 10 years at 85C), it is important to
read the pre-determined value in advamce and to re-write the same data back into EEPROM after an exposure to the
excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated
temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to
re-write it after the test. Access to un-used address locations is not functionally guaranteed.
Refer to section-Ⅵ 8.3 for EEPROM map.
<MS0189-E-01>
-6-
2004/5
AKM [ ASAHI KASEI MICROSYSTEMS ]
