Wire Supplying
Vbias from
Agilent 4142
Blocking
Cap
Direct to
Ground
62x
62x
Bias
Bias
Tee
Vdd supply from
Agilent 4142
RF
Input
Direct to
Ground
RF Output
Reference
Planes
Figure 1b. A diagram showing the connection to the DUT during an S and Noise parameter mea-
surement using an automated tuner system.
Product Consistency Distribution Charts at 3 V, 0.5 GHz, R
bias
= 240Ω
[1, 2]
150
cpk=2.45
stdev=0.06
150
cpk=1.3
stdev=0.36
120
100
80
60
40
-3 std
cpk=1.9
stdev=0.51
120
120
FREQUENCY
FREQUENCY
90
+3 std
90
-3 std
+3 std
60
60
30
30
FREQUENCY
20
0
29
0
0.6
0.8
1
NF (dB)
1.2
1.4
0
19
20
21
22
23
24
30
31
32
OIP3 (dBm)
33
34
35
GAIN (dB)
Figure 2. NF @ 0.5 GHz 3V 60 mA.
USL=1.4, Nominal=0.93.
Figure 3. Gain @ 0.5 GHz 3V 60 mA.
USL=23.4, Nominal=20.4, USL=22.0.
Figure 4. OIP3 @ 0.5 GHz 3V 60 mA.
LSL=30, Nominal=32.9.
120
100
80
cpk=2.39
stdev=2.09
60
40
20
0
47
-3 std
+3 std
52
57
62
Id (mA)
67
72
77
2800
2600
2400
2200
2000
1800
1600
1400
1200
1000
800
600
400
200
0
5500
5000
4500
4000
FREQUENCY
Rbias (ohm)
Rbias (ohm)
3500
3000
2500
2000
1500
1000
500
0
10
20
30
40
50
60
70
80
90
0
0
10
20
30
40
50
60
70
80
90
Id (mA)
Id (mA)
Figure 5. Id @ 3V.
LSL=47, Nominal=77, USL=62.0.
Figure 6. Rbias vs. Id (3V supply).
Figure 7. Rbias vs. Id (5V supply).
Note:
1. Measured on the production test circuit
2. Distribution data sample size is 250 samples taken from 5 different wafers. Future wafers allocated
to this product may have nominal values anywhere between upper and lower limits
3