PULSE GEN.
= 50 Ω
Z
O
t
= t = 5 ns
f
r
INPUT V
MONITORING NODE
E
+5 V
V
3.0 V
1.5 V
1
2
3
4
8
7
6
5
CC
INPUT
V
7.5 mA
E
0.1 µF
BYPASS
R
L
I
F
t
t
EHL
ELH
OUTPUT V
MONITORING
NODE
O
OUTPUT
V
O
1.5 V
*C
L
GND
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
Figure 13. Test Circuit for tEHL and tELH
.
120
V
V
V
= 5.0 V
= 3.0 V
= 0 V
CC
EH
EL
I
= 7.5 mA
F
90
60
t
, R = 4 kΩ
L
ELH
t
, R = 1 kΩ
ELH
L
30
0
t
, R = 350 Ω
ELH
L
t
, R = 350 Ω, 1 kΩ, 4 kΩ
EHL
L
-60 -40 -20
0
20 40 60 80 100
T
– TEMPERATURE – °C
A
Figure 14. Typical Enable Propagation
Delay vs. Temperature.
I
F
SINGLE CHANNEL
DUAL CHANNEL
B
I
F
V
1
2
3
4
8
7
6
5
+5 V
V
CC
+5 V
CC
1
2
3
4
8
A
R
B
A
L
OUTPUT V
MONITORING
NODE
0.1 µF
BYPASS
O
R
7
6
5
L
V
FF
OUTPUT V
MONITORING
NODE
O
V
FF
0.1 µF
BYPASS
GND
GND
V
CM
V
CM
+
–
+
–
PULSE
GENERATOR
= 50 Ω
PULSE
GENERATOR
= 50 Ω
Z
Z
O
O
V
CM
(PEAK)
V
CM
0 V
5 V
SWITCH AT A: I = 0 mA
F
CM
H
V
O
V
(MIN.)
O
SWITCH AT B: I = 7.5 mA
F
V
(MAX.)
O
V
O
0.5 V
CM
L
Figure 15. Test Circuit for Common Mode Transient Immunity and Typical Waveforms.
1-161
AGILENT [ AGILENT TECHNOLOGIES, LTD. ]
