Data Acquisition and Stimulus
Pattern Generation Modules
Digital Stimulus and Response in a
Single Instrument
Parallel Testing of Subsystems
Reduces Time to Market
Configure the logic analysis
system to provide both stimulus
and response in a single
instrument. For example, the
pattern generator can simulate a
By testing system subcomponents
before they are complete, you
can fix problems earlier in the
development process. Use the
Agilent 16720A as a substitute
circuit initialization sequence and for missing boards, integrated
then signal the state or timing
analyzer to begin measurements.
Use the compare mode on the
state analyzer to determine if the
circuits (ICs), or buses instead
of waiting for the missing pieces.
Software engineers can create
infrequently encountered test
circuit or subsystem is functioning conditions and verify that their
as expected. Time correlate to
an external oscilloscope to help
locate the source of timing
problems or troubleshoot signal
problems due to noise, ringing,
overshoot, crosstalk, or
code works—before complete
hardware is available. Hardware
engineers can generate the
patterns necessary to put their
circuit in the desired state,
operate the circuit at full speed
or step the circuit through a
series of states.
simultaneous switching.
Key Characteristics
Agilent Model 16720A
Maximum clock (full/half channel)
Number of data channels (full/half channel)
Memory depth (full/half channels)
180/300 MHz
48/24 Channels
8/16 MVectors
240/120 Bits
Maximum vector width
(5 module system, full/half channel)
Logic levels supported
5V TTL, 3-state TTL, 3-state TTL/CMOS,
3-state 1.8V, 3-state 2.5V, 3-state 3.3V,
ECL, 5V PECL, 3.3V LVPECL, LVDS
Editable vector size (full/half channels)
8/16 MVectors
4
AGILENT [ AGILENT TECHNOLOGIES, LTD. ]
