Preliminary Data Sheet
November 1998
W3013 Indirect Quadrature Modulator
with Gain Control
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are
absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in
excess of those given in the operations sections of the data sheet. Exposure to absolute maximum ratings for
extended periods can adversely affect device reliability.
Parameter
Ambient Operating Temperature
Storage Temperature
Symbol
TA
Min
–40
–65
—
Max
100
150
300
5
Unit
°C
Tstg
TL
°C
Lead Temperature (soldering, 10 s)
Positive Supply Voltage
Power Dissipation
°C
VCC
PD
—
Vdc
mW
mA
Vp-p
Vdc
—
750
160
VCC
VCC
Output Current (continuous)
ac Input Voltage
IOUT
—
—
GND
GND
Enable Input Voltage
VENB
Handling Precautions
Although protection circuitry has been designed into this device, proper precautions should be taken to avoid
exposure to electrostatic discharge (ESD) during handling and mounting. Lucent Technologies Microelectronics
Group employs a human-body model (HBM) and a charged-device model (CDM) for ESD-susceptibility testing
and protection design evaluation. ESD voltage thresholds are dependent on the circuit parameters used to define
the model. No industry-wide standard has been adopted for CDM. However, a standard HBM (resistance =
1500 W, capacitance = 100 pF) is widely used and, therefore, can be used for comparison purposes. The HBM
ESD threshold presented here was obtained by using these circuit parameters:
ESD Threshold Voltage
Device
W3013
W3013
Rating
³ 1000 V
³ 1000 V
Model
HBM
CDM
Lucent Technologies Inc.
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