Data Sheet
November 1999
L7581 Ringing Access Switch
Pin Information
(continued)
Table 1. Pin Descriptions
DIP SOG
1
1
2
3
4
5
6
7
8
4
2
3
6
7
5
8
Symbol
F
GND
NC
T
BAT
T
LINE
T
RINGING
V
DD
NC
T
SD
Description
Fault ground.
No connection.
Connect to TIP on SLIC side.
Connect to TIP on line side.
Connect to return ground for
ringing generator.
5 V supply.
DIP SOG
16
16
15
14
13
12
11
13
15
14
12
11
10
9
Symbol
V
BAT
NC
R
BAT
R
LINE
R
RINGING
LATCH
INPUT
D
GND
Description
Battery voltage. Used as a ref-
erence for protection circuit.
No connection.
Connect to RING on SLIC side.
Connect to RING on line side.
Connect to ringing generator.
Data latch control, active-high,
transparent low.
Logic level input switch control.
Digital ground.
No connection.
10
9
Temperature shutdown pin. Can
be used as a logic level input or
output. See Table 12, Truth
Table, and the Switching Behav-
ior section of this data sheet for
input pin description. As an out-
put, will read 5 V when device is
in its operational mode and 0 V
in the thermal shutdown mode.
In the L7581, the thermal shut-
down mechanism cannot be dis-
abled.
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings
can cause permanent damage to the device. These are
absolute stress ratings only. Functional operation of the
device is not implied at these or any other conditions in
excess of those given in the operational sections of the
data sheet. Exposure to absolute maximum ratings for
extended periods can adversely affect device reliability.
Table 2. Absolute Maximum Ratings Parameters
Parameter
Operating Temperature Range
Storage Temperature Range
Relative Humidity Range
Pin Soldering Temperature
5 V Power Supply
Battery Supply
Logic Input Voltage
Input-to-output Isolation
Pole-to-pole Isolation
Min
–40
–40
5
—
—
—
—
—
—
Max
110
150
95
10
7
–85
7
330
330
Unit
°C
°C
%
°C
V
V
V
V
V
Handling Precautions
Although protection circuitry has been designed into
this device, proper precautions should be taken to
avoid exposure to electrostatic discharge (ESD) during
handling and mounting. Lucent Technologies Micro-
electronics Group employs a human-body model
(HBM) and a charged-device model (CDM) for ESD-
susceptibility testing and protection design evaluation.
ESD voltage thresholds are dependent on the circuit
parameters used to define the model. No industry-wide
standard has been adopted for CDM. However, a stan-
dard HBM (resistance = 1500
Ω,
capacitance = 100 pF)
is widely used and therefore can be used for compari-
son purposes. The HBM ESD threshold presented
here was obtained by using these circuit parameters.
Table 3. HBM ESD Threshold Voltage
Device
L7581
Rating
1000 V
Lucent Technologies Inc.
3
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