OP37
SPECIFICATIONS
( V =
S
15 V, T
A
= 25 C, unless otherwise noted.)
OP37A/E
Min Typ Max
10
0.2
7
±
10
25
1.0
35
±
40
0.18
5.5
4.5
3.8
4.0
2.3
0.6
0.9
OP37F
Min Typ Max
20
0.3
9
±
12
0.08
3.5
3.1
3.0
1.7
1.0
0.4
45
2.5
±
11
106
10
±
12.3
123
1
10
±
11
100
60
1.5
50
±
55
0.18
5.5
4.5
3.8
4.0
2.3
0.6
0.7
OP37G
Min Typ Max
30
0.4
12
±
15
0.09
3.8
3.3
3.2
1.7
1.0
0.4
4
2
±
12.3
120
2
20
100
2.0
75
±
80
0.25
8.0
5.6
4.5
Unit
µV
µV/Mo
nA
nA
µV
p-p
nV/√
Hz
Parameter
Input Offset
Voltage
Long-Term
Stability
Input Offset
Current
Input Bias
Current
Input Noise
Voltage
Input Noise
Voltage Density
Input Noise
CurrentDensity
Input Resistance
Differential
Mode
Input Resistance
Common Mode
Input Voltage
Range
Common Mode
Rejection Ratio
Power Supply
Rejection Ratio
Large Signal
Voltage Gain
Symbol
V
OS
V
OS
/Time
I
OS
I
B
e
np-p
e
n
Conditions
Note 1
Notes 2, 3
1 Hz to 10 Hz
3, 5
f
O
= 10 Hz
3
f
O
= 30 Hz
3
f
O
= 1000 Hz
3
f
O
= 10 Hz
3, 6
f
O
= 30 Hz
3, 6
f
O
= 1000 Hz
3, 6
Note 7
1.3
0.08
3.5
3.1
3.0
1.7
1.0
0.4
6
3
±
11
±
12.3
126
1
i
N
pA/√
Hz
0.6
MΩ
GΩ
V
dB
µV/
V
R
IN
R
INCM
IVR
CMRR
PSSR
A
VO
V
CM
=
±
11 V
V
S
=
±
4 V
to
±
18 V
R
L
≥
2 kΩ,
V
O
=
±
10 V
R
L
≥
1 kΩ,
Vo =
±
10 V
R
L
≥
600
Ω,
V
O
=
±
1 V,
V
S
±
4
4
R
L
≥
2 kΩ
R
L
≥
600
Ω
R
L
≥
2k
Ω
4
f
O
= 10 kHz
4
f
O
= 1 MHz
V
O
= 0, I
O
= 0
V
O
= 0
R
P
= 10 kΩ
114
1000
800
250
1800
1500
700
1000
800
250
1800
1500
700
700
400
200
1500
1500
500
V/m V
V/m V
V/m V
V
V
V/µs
MHz
MHz
Ω
170
mW
mV
Output Voltage
Swing
V
O
Slew Rate
SR
Gain Bandwidth
Product
GBW
Open-Loop
Output Resistance R
O
Power
Consumption
P
d
Offset Adjustment
Range
±
12.0
±
13.8
±
10
±
11.5
11
17
45
63
40
70
90
±
4
140
±
12.0
±
13.8
±
10
±
11.5
11
17
45
63
40
70
90
±
4
140
±
11.5
±
13.5
±
10
±
11.5
11
17
45
63
40
70
100
±
4
NOTES
1
Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully
warmed up.
2
Long term input offset voltage stability refers to the average trend line of V
OS
vs. Time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5
µV—refer
to typical performance curve.
3
Sample tested.
4
Guaranteed by design.
5
See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.
6
See test circuit for current noise measurement.
7
Guaranteed by input bias current.
REV. A
–3–
AD [ ANALOG DEVICES ]
