SPECIFICATIONS
( V =
S
15 V, T
A
= 25 C, unless otherwise noted.)
Min Typ Max
10
0.2
7
±
10
25
1.0
35
±
40
0.18
5.5
4.5
3.8
4.0
2.3
0.6
0.9
Min Typ Max
20
0.3
9
±
12
0.08
3.5
3.1
3.0
1.7
1.0
0.4
45
2.5
±
11
106
10
±
12.3
123
1
10
±
11
100
60
1.5
50
±
55
0.18
5.5
4.5
3.8
4.0
2.3
0.6
0.7
Min Typ Max
30
0.4
12
±
15
0.09
3.8
3.3
3.2
1.7
1.0
0.4
4
2
±
12.3
120
2
20
100
2.0
75
±
80
0.25
8.0
5.6
4.5
Unit
mV
mV/Mo
nA
nA
mV
p-p
nV/÷
Hz
Parameter
Input Offset
Voltage
Long-Term
Stability
Input Offset
Current
Input Bias
Current
Input Noise
Voltage
Input Noise
Voltage Density
Symbol
V
OS
V
OS
/Time
I
OS
I
B
e
np-p
e
n
Conditions
Note 1
Notes 2, 3
1 Hz to 10 Hz
3, 5
f
O
= 10 Hz
3
f
O
= 30 Hz
3
f
O
= 1000 Hz
3
f
O
= 10 Hz
3, 6
f
O
= 30 Hz
3, 6
f
O
= 1000 Hz
3, 6
Note 7
1.3
0.08
3.5
3.1
3.0
1.7
1.0
0.4
6
3
±
11
±
12.3
126
1
Input Noise
Current Density i
N
Input Resistance
Differential
Mode
Input Resistance
Common Mode
Input Voltage
Range
Common Mode
Rejection Ratio
Power Supply
Rejection Ratio
Large Signal
Voltage Gain
pA/÷
Hz
0.6
MW
GW
V
dB
mV/
V
R
IN
R
INCM
IVR
CMRR
PSSR
A
VO
V
CM
=
±
11 V
V
S
=
±
4 V
to
±
18 V
R
L
≥
2 kW,
V
O
=
±
10 V
R
L
≥
1 kW,
Vo =
±
10 V
R
L
≥
600
W,
V
O
=
±
1 V,
V
S
±
4
4
R
L
≥
2 kW
R
L
≥
600
W
R
L
≥
2k
W
4
f
O
= 10 kHz
4
f
O
= 1 MHz
V
O
= 0, I
O
= 0
V
O
= 0
R
P
= 10 kW
114
1000
800
250
1800
1500
700
1000
800
250
1800
1500
700
700
400
200
1500
1500
500
V/mV
V/mV
V/mV
V
V
V/ms
MHz
MHz
W
170
mW
mV
Output Voltage
Swing
V
O
Slew Rate
SR
Gain Bandwidth
Product
GBW
Open-Loop
Output Resistance R
O
Power
Consumption
P
d
Offset Adjustment
Range
±
12.0
±
13.8
±
10
±
11.5
11
17
45
63
40
70
90
±
4
140
±
12.0
±
13.8
±
10
±
11.5
11
17
45
63
40
70
90
±
4
140
±
11.5
±
13.5
±
10
±
11.5
11
17
45
63
40
70
100
±
4
NOTES
1
Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully
warmed up.
2
Long term input offset voltage stability refers to the average trend line of V
OS
vs. Time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5
mV—refer
to typical performance curve.
3
Sample tested.
4
Guaranteed by design.
5
See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.
6
See test circuit for current noise measurement.
7
Guaranteed by input bias current.
REV. B
–3–
AD [ ANALOG DEVICES ]
