DAC08
WAFER TEST LIMITS
Parameter
Resolution
Monotonicity
Nonlinearity
Output Voltage
Compliance
Full-Scale Current
Full-Scale Symmetry
Zero-Scale Current
Output Current Range
(@ V
S
= 15 V, I
REF
= 2.0 mA; T
A
= 25 C, unless otherwise noted. Output characteristics apply to both
I
OUT
and
I
OUT
.)
Symbol
Conditions
DAC08N
Limit
8
8
±
0.1
+18
–10
2.04
1.94
±
8
2
2.1
4.2
0.8
2
V
LC
= 0 V
V
IN
= –10 V to +0.8 V
V
IN
= +2.0 V to +18 V
V– = –15 V
±
10
±
10
+18
–10
–3
0.01
DAC08G
Limit
8
8
±
0.19
+18
–10
2.04
1.94
±
8
4
2.1
4.2
0.8
2
±
10
±
10
+18
–10
–3
0.01
DAC08GR
Limit
8
8
±
0.39
+18
–10
2.04
1.94
±
16
4
2.1
4.2
0.8
2
±
10
±
10
+18
–10
–3
0.01
Unit
Bits min
Bits min
% FS max
V max
V min
mA max
mA min
µA
max
µA
max
mA min
mA min
V max
V min
µA
max
µA
max
V max
V min
µA
max
% FS/% V max
NL
V
OC
I
FS4
or
I
FS2
I
FSS
I
ZS
I
FS1
or
Full-Scale Current
Change < 1/2 LSB
V
REF
= 10.000 V
R
14
, R
15
= 5.000 kΩ
I
FS2
Logic Input “0”
Logic Input “1”
Logic Input Current
Logic “0”
Logic “1”
Logic Input Swing
Reference Bias Current
Power Supply
Sensitivity
Power Supply Current
Power Dissipation
V
IL
V
IH
I
IL
I
IH
V
IS
I
15
PSSI
FS+
PSSI
FS–
I+
P
D
V– = –10 V,
V
REF
= +15 V
V– = –12 V,
V
REF
= +25 V
R
14
, R
15
= 5.000 kΩ
V+ = +4.5 V to +18 V
V– = –4.5 V to –18 V
I
REF
= 1.0 mA
V
S
=
±
15 V
I
REF
≤
2.0 mA
V
S
=
±
15 V
I
REF
≤
2.0 mA
3.8
–7.8
174
3.8
–7.8
174
3.8
–7.8
174
mA max
µA
max
mW max
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. B
–5–
AD [ ANALOG DEVICES ]
