ADuM1410/ADuM1411/ADuM1412
For example, at a magnetic field frequency of 1 MHz, the
maximum allowable magnetic field of 0.2 kgauss induces a
voltage of 0.25 V at the receiving coil. This is about 50% of the
sensing threshold and does not cause a faulty output transition.
Similarly, if such an event occurred during a transmitted pulse
(and had the worst-case polarity), it would reduce the received
pulse from >1.0 V to 0.75 V, still well above the 0.5 V sensing
threshold of the decoder.
POWER CONSUMPTION
The supply current at a given channel of the ADuM141x
isolator is a function of the supply voltage, the data rate of the
channel, and the output load of the channel.
For each input channel, the supply current is given by
IDDI = IDDI (Q)
DDI = IDDI (D) × (2f − fr) + IDDI (Q)
f ≤ 0.5 fr
f > 0.5 fr
I
The preceding magnetic flux density values correspond to
specific current magnitudes at given distances from the
ADuM141x transformers. Figure 19 shows these allowable
current magnitudes as a function of frequency for selected
distances. As shown, the ADuM141x is extremely immune and
can be affected only by extremely large currents operated at
high frequency very close to the component. For the 1 MHz
example noted previously, a 0.5 kA current would have to be
placed 5 mm away from the ADuM141x to affect the operation
of the component.
For each output channel, the supply current is given by
I
I
DDO = IDDO (Q)
f ≤ 0.5 fr
DDO = (IDDO (D) + (0.5 × 10−3) × CL × VDDO) × (2f − fr) + IDDO (Q)
f > 0.5 fr
where:
DDI (D), IDDO (D) are the input and output dynamic supply currents
I
per channel (mA/Mbps).
CL is the output load capacitance (pF).
V
DDO is the output supply voltage (V).
1000
f is the input logic signal frequency (MHz); it is half the input
data rate, expressed in units of Mbps.
fr is the input stage refresh rate (Mbps).
DISTANCE = 1m
100
I
DDI (Q), IDDO (Q) are the specified input and output quiescent
10
supply currents (mA).
DISTANCE = 100mm
To calculate the total VDD1 and VDD2 supply current, the supply
currents for each input and output channel corresponding to
1
DISTANCE = 5mm
VDD1 and VDD2 are calculated and totaled. Figure 8 and Figure 9
0.1
show per-channel supply currents as a function of data rate for
an unloaded output condition. Figure 10 shows the per-channel
supply current as a function of data rate for a 15 pF output
condition. Figure 11 through Figure 15 show the total VDD1 and
0.01
1k
10k
100k
1M
10M
100M
MAGNETIC FIELD FREQUENCY (Hz)
VDD2 supply current as a function of data rate for ADuM1410/
Figure 19. Maximum Allowable Current for Various
Current-to-ADuM141x Spacings
ADuM1411/ADuM1412 channel configurations.
INSULATION LIFETIME
Note that at combinations of strong magnetic field and high
frequency, any loops formed by printed circuit board traces can
induce error voltages sufficiently large enough to trigger the
thresholds of succeeding circuitry. Care should be taken in the
layout of such traces to avoid this possibility.
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of
insulation degradation is dependent on the characteristics of the
voltage waveform applied across the insulation. In addition to
the testing performed by the regulatory agencies, Analog
Devices carries out an extensive set of evaluations to determine
the lifetime of the insulation structure within the ADuM141x.
Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage.
Acceleration factors for several operating conditions are
determined. These factors allow calculation of the time to
failure at the actual working voltage. The values shown in
Table 10 summarize the peak voltage for 50 years of service life
for a bipolar ac operating condition and the maximum
CSA/VDE approved working voltages. In many cases, the
approved working voltage is higher than 50-year service life
voltage. Operation at these high working voltages can lead to
shortened insulation life in some cases.
Rev. H | Page 20 of 24
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