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ADM211EARU 参数 Datasheet PDF下载

ADM211EARU图片预览
型号: ADM211EARU
PDF下载: 下载PDF文件 查看货源
内容描述: EMI / EMC兼容, ±15千伏ESD保护, RS - 232线路驱动器/接收器 [EMI/EMC Compliant, +-15 kV ESD Protected, RS-232 Line Drivers/Receivers]
分类和应用: 驱动器
文件页数/大小: 16 页 / 208 K
品牌: ADI [ ADI ]
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ADM206E/ADM207E/ADM208E/ADM211E/ADM213E  
R1  
R2  
Table IV. IEC1000-4-2 Compliance Levels  
HIGH  
VOLTAGE  
GENERATOR  
DEVICE  
UNDER TEST  
Contact Discharge  
kV  
Air Discharge  
kV  
C1  
Level  
1
2
3
4
2
4
6
8
2
4
8
15  
ESD TEST METHOD  
H. BODY MIL-STD883B  
IEC1000-4-2  
R2  
C1  
1.5k  
330⍀  
100pF  
150pF  
Figure 25. ESD Test Standards  
Table V. ADM2xxE ESD Test Results  
ESD Test Method  
I-O Pins  
Other Pins  
100  
90  
MIL-STD-883B  
IEC1000-4-2  
Contact  
±15 kV  
±2.5 kV  
±8 kV  
Air  
±15 kV  
FAST TRANSIENT BURST TESTING (IEC1000-4-4)  
IEC1000-4-4 (previously 801-4) covers electrical fast-transient/  
burst (EFT) immunity. Electrical fast transients occur as a  
result of arcing contacts in switches and relays. The tests simu-  
late the interference generated when for example a power relay  
disconnects an inductive load. A spark is generated due to the  
well known back EMF effect. In fact the spark consists of a  
burst of sparks as the relay contacts separate. The voltage appear-  
ing on the line, therefore, consists of a bust of extremely fast tran-  
sient impulses. A similar effect occurs when switching on  
fluorescent lights.  
36.8  
10  
tDL  
tRL  
TIME t  
Figure 26. Human Body Model ESD Current Waveform  
100  
90  
The fast transient burst test defined in IEC1000-4-4 simulates  
this arcing and its waveform is illustrated in Figure 28. It con-  
sists of a burst of 2.5 kHz to 5 kHz transients repeating at  
300 ms intervals. It is specified for both power and data lines.  
V
10  
0.1 TO 1ns  
TIME t  
30ns  
t
60ns  
300ms  
15ms  
Figure 27. IEC1000-4-2 ESD Current Waveform  
5ns  
V
The ADM2xxE family of products are tested using both the  
above mentioned test methods. All pins are tested with respect  
to all other pins as per the MIL-STD-883B specification. In  
addition all I-O pins are tested as per the IEC test specification.  
The products were tested under the following conditions:  
50ns  
t
(a) Power-On—Normal Operation  
(b) Power-On—Shutdown Mode  
(c) Power-Off  
0.2/0.4ms  
Figure 28. IEC1000-4-4 Fast Transient Waveform  
There are four levels of compliance defined by IEC1000-4-2.  
The ADM2xxE family of products meet the most stringent  
compliance level for both contact and for air-gap discharge. This  
means that the products are able to withstand contact discharges in  
excess of 8 kV and air-gap discharges in excess of 15 kV.  
–11–  
REV. B