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ADM202EARWZ 参数 Datasheet PDF下载

ADM202EARWZ图片预览
型号: ADM202EARWZ
PDF下载: 下载PDF文件 查看货源
内容描述: EMI / EMC兼容, ±15千伏ESD保护的RS - 232线路驱动器/接收器 [EMI/EMC-Compliant, +-15 kV, ESD-Protected RS-232 Line Drivers/Receivers]
分类和应用: 驱动器
文件页数/大小: 16 页 / 245 K
品牌: ADI [ ADI ]
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ASM202E/ASM±±8±A  
Table 4. IEC1000-4-2 Compliance Levels  
A simplified circuit diagram of the actual EFT generator is  
illustrated in Figure 22.  
Level  
Contact Discharge  
Air Discharge  
2 kV  
4 kV  
8 kV  
15 kV  
1
2
3
4
2 kV  
4 kV  
6 kV  
8 kV  
The transients are coupled onto the signal lines using an EFT  
coupling clamp. The clamp, which is 1 m long, completely  
surrounds the cable, providing maximum coupling capacitance  
(50 pF to 200 pF typ) between the clamp and the cable. High  
energy transients are capacitively coupled to the signal lines.  
Fast rise times (5 ns), as specified by the standard, result in very  
effective coupling. This test is very strenuous because high voltages  
are coupled onto the signal lines. The repetitive transients often  
cause problems where single pulses do not. Destructive latch-up  
can be induced due to the high energy content of the transients.  
Note that this stress is applied while the interface products are  
powered up and transmitting data. The EFT test applies  
hundreds of pulses with higher energy than ESD. Worst-case  
transient current on an I/O line can be as high as 40 A.  
Table 5. ADM202E/ADM1181A ESD Test Results  
ESD Test Method  
MIL-STD-883B  
IEC1000-4-2  
Contact  
I/O Pins  
±15 kV  
±8 kV  
Air  
±15 kV  
FAST TRANSIENT/BURST TESTING (IEC1000-4-4)  
IEC1000-4-4 (previously 801-4) covers electrical fast transient  
(EFT)/burst immunity. Electrical fast transients occur as a result  
of arcing contacts in switches and relays. The tests simulate the  
interference generated when, for example, a power relay  
disconnects an inductive load. A spark is generated due to the  
well-known back EMF effect. In fact, the spark consists of a  
burst of sparks as the relay contacts separate. The voltage  
appearing on the line, therefore, consists of a burst of extremely  
fast transient impulses. A similar effect occurs when switching  
on fluorescent lights.  
C
D
R
R
M
HIGH  
VOLTAGE  
SOURCE  
L
C
50  
OUTPUT  
Z
C
S
C
Figure 22. IEC1000-4-4 Fast Transient Generator  
Test results are classified according to the following:  
Classification 1: Normal performance within specifi-  
cation limits  
The fast transient/burst test defined in IEC1000-4-4 simulates  
this arcing, and its waveform is illustrated in Figure 17. It  
consists of a burst of 2.5 kHz to 5 kHz transients repeating at  
300 ms intervals. It is specified for both power and data lines.  
Classification 2: Temporary degradation or loss of  
performance that is self-recoverable  
Classification 3: Temporary degradation or loss of function  
or performance that requires operator intervention or  
system reset  
V
Classification 4: Degradation or loss of function that is not  
recoverable due to damage  
t
300ms  
15ms  
The ADM202E/ADM1181A meet Classification 2 and have  
been tested under worst-case conditions using unshielded  
cables. Data transmission during the transient condition is  
corrupted, but can resume immediately following the EFT event  
without user intervention.  
5ns  
V
50ns  
t
0.2/0.4ms  
Figure 21. IEC1000-4-4 Fast Transient Waveform  
Rev. C | Page 11 of 16