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ADIS16362BMLZ 参数 Datasheet PDF下载

ADIS16362BMLZ图片预览
型号: ADIS16362BMLZ
PDF下载: 下载PDF文件 查看货源
内容描述: 六自由度惯性传感器 [Six Degrees of Freedom Inertial Sensor]
分类和应用: 传感器
文件页数/大小: 20 页 / 513 K
品牌: ADI [ ADI ]
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ADIS16362  
Parameter  
Test Conditions/Comments  
Min  
Typ  
Max  
Unit  
DAC OUTPUT  
ꢀ kΩ/±00 pF to GND  
Resolution  
±2  
±4  
±±  
±ꢀ  
Bits  
LSB  
LSB  
mV  
%
Relative Accuracy  
Differential Nonlinearity  
Offset Error  
±0± LSB ≤ input code ≤ 409ꢀ LSB  
Gain Error  
±0.ꢀ  
Output Range  
0
3.3  
V
Output Impedance  
Output Settling Time  
LOGIC INPUTS±  
Input High Voltage, VIH  
Input Low Voltage, VIL  
2
±0  
Ω
μs  
2.0  
20  
V
V
V
0.8  
0.ꢀꢀ  
CS signal to wake up from sleep mode  
CS Wake-Up Pulse Width  
Logic ± Input Current, IIH  
Logic 0 Input Current, IIL  
All Pins Except RST  
μs  
μA  
VIH = 3.3 V  
VIL = 0 V  
±0.2  
±±0  
ꢃ0  
40  
±
ꢄA  
mA  
pF  
RST Pin  
Input Capacitance, CIN  
DIGITAL OUTPUTS±  
Output High Voltage, VOH  
Output Low Voltage, VOL  
FLASH MEMORY  
±0  
ISOURCE = ±.ꢃ mA  
ISINK = ±.ꢃ mA  
Endurance2  
TJ = 8ꢀ°C  
2.4  
V
V
0.4  
±0,000  
20  
Cycles  
Years  
Data Retention3  
FUNCTIONAL TIMES4  
Power-On Start-Up Time  
Time until data is available  
Normal mode, SMPL_PRD ≤ 0x09  
Low power mode, SMPL_PRD ≥ 0x0A  
Normal mode, SMPL_PRD ≤ 0x09  
Low power mode, SMPL_PRD ≥ 0x0A  
Normal mode, SMPL_PRD ≤ 0x09  
Low power mode, SMPL_PRD ≥ 0x0A  
Normal mode, SMPL_PRD ≤ 0x09  
Low power mode, SMPL_PRD ≥ 0x0A  
SMPL_PRD = 0x0±  
±80  
2ꢀ0  
ꢃ0  
±30  
4
ms  
ms  
ms  
ms  
ms  
ms  
ms  
ms  
ms  
SPS  
%
Reset Recovery Time  
Sleep Mode Recovery Time  
Flash Memory Test Time  
9
±ꢁ  
90  
±2  
Automatic Self-Test Time  
CONVERSION RATE  
Clock Accuracy  
SMPL_PRD = 0x0± to 0xFF  
0.4±3  
8±9.2  
±3  
Sync Input Clock  
0.8ꢀ  
4.ꢁꢀ  
±.2  
kHz  
V
mA  
mA  
μA  
POWER SUPPLY  
Power Supply Current  
Operating voltage range, VCC  
Low power mode  
Normal mode  
ꢀ.0  
24  
49  
ꢀ.2ꢀ  
Sleep mode  
ꢀ00  
± The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are ꢀ V tolerant.  
2 Endurance is qualified as per JEDEC Standard 22, Method A±±ꢁ, and measured at −40°C, +2ꢀ°C, +8ꢀ°C, and +±2ꢀ°C.  
3 The data retention lifetime equivalent is at a junction temperature (TJ) of 8ꢀ°C as per JEDEC Standard 22, Method A±±ꢁ. Data retention lifetime decreases with junction  
temperature.  
4 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.  
The sync input clock functions below the specified minimum value, at reduced performance levels.  
Rev. 0 | Page 4 of 20  
 
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